Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 2292-2295 |
| Seitenumfang | 4 |
| Fachzeitschrift | Physical review letters |
| Jahrgang | 71 |
| Ausgabenummer | 14 |
| Publikationsstatus | Veröffentlicht - 1 Jan. 1993 |
| Extern publiziert | Ja |
Abstract
In the quantum Hall regime the influence of edge channels on the evolution of the current through the device has been analyzed by time-resolved transport measurements. The observed nonlinear dependence of the time-resolved current on applied voltage is qualitatively in agreement with the model describing edge channels as compressible strips separated by incompressible regions.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Allgemeine Physik und Astronomie
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in: Physical review letters, Jahrgang 71, Nr. 14, 01.01.1993, S. 2292-2295.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Time-resolved measurements of transport in edge channels
AU - Zhitenev, N. B.
AU - Haug, R. J.
AU - Klitzing, K. V.
AU - Eberl, K.
PY - 1993/1/1
Y1 - 1993/1/1
N2 - In the quantum Hall regime the influence of edge channels on the evolution of the current through the device has been analyzed by time-resolved transport measurements. The observed nonlinear dependence of the time-resolved current on applied voltage is qualitatively in agreement with the model describing edge channels as compressible strips separated by incompressible regions.
AB - In the quantum Hall regime the influence of edge channels on the evolution of the current through the device has been analyzed by time-resolved transport measurements. The observed nonlinear dependence of the time-resolved current on applied voltage is qualitatively in agreement with the model describing edge channels as compressible strips separated by incompressible regions.
UR - http://www.scopus.com/inward/record.url?scp=0001673926&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.71.2292
DO - 10.1103/PhysRevLett.71.2292
M3 - Article
AN - SCOPUS:0001673926
VL - 71
SP - 2292
EP - 2295
JO - Physical review letters
JF - Physical review letters
SN - 0031-9007
IS - 14
ER -