TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • Philipp Mand
  • Volodymyr Burkhay
  • Andre Rocke
  • Uwe Gieselmann
  • Leon Fauth
  • Markus Olbrich
  • Christophe Delepaut
  • Bernhard Wicht
  • Jens Friebe

Externe Organisationen

  • European Space Research and Technology Centre (ESTEC)
  • Space Ic GmbH
  • Universität Kassel
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des Sammelwerks2023 13th European Space Power Conference, ESPC 2023
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
ISBN (elektronisch)979-8-3503-2899-8
ISBN (Print)979-8-3503-2900-1
PublikationsstatusVeröffentlicht - 2023
Veranstaltung13th European Space Power Conference, ESPC 2023 - Elche, Spanien
Dauer: 2 Okt. 20236 Okt. 2023

Abstract

High-performance applications that require a high output current and a faster transient response increase the need to place the power supply as close as possible to the load. A Point-of-Load converter is specifically designed to meet this requirement. In space, additional reliability criteria such as extended temperature ranges and radiation tolerance are important. In this paper the Total Ionizing Dose and Destructive Single Event Effects on a prototype rad-hard Point-of-Load converter for space applications are evaluated. The device is a fully integrated DC-DC converter IC with two switches and the control on one die. The device is capable of 40 V input and 8 A continuous output current. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. The radiation effects are analyzed and possible improvements in the design are given. Since not all transistors of the ATMX150RHA technology were previously tested against radiation, this paper gives more information on the radiation response of this technology.

ASJC Scopus Sachgebiete

Zitieren

TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications. / Mand, Philipp; Burkhay, Volodymyr; Rocke, Andre et al.
2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc., 2023.

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Mand, P, Burkhay, V, Rocke, A, Gieselmann, U, Fauth, L, Olbrich, M, Delepaut, C, Wicht, B & Friebe, J 2023, TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications. in 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc., 13th European Space Power Conference, ESPC 2023, Elche, Spanien, 2 Okt. 2023. https://doi.org/10.1109/espc59009.2023.10413247
Mand, P., Burkhay, V., Rocke, A., Gieselmann, U., Fauth, L., Olbrich, M., Delepaut, C., Wicht, B., & Friebe, J. (2023). TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications. In 2023 13th European Space Power Conference, ESPC 2023 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/espc59009.2023.10413247
Mand P, Burkhay V, Rocke A, Gieselmann U, Fauth L, Olbrich M et al. TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications. in 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc. 2023 doi: 10.1109/espc59009.2023.10413247
Mand, Philipp ; Burkhay, Volodymyr ; Rocke, Andre et al. / TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications. 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc., 2023.
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@inproceedings{1a34bfea6a6d4e76920958f4504171f5,
title = "TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications",
abstract = "High-performance applications that require a high output current and a faster transient response increase the need to place the power supply as close as possible to the load. A Point-of-Load converter is specifically designed to meet this requirement. In space, additional reliability criteria such as extended temperature ranges and radiation tolerance are important. In this paper the Total Ionizing Dose and Destructive Single Event Effects on a prototype rad-hard Point-of-Load converter for space applications are evaluated. The device is a fully integrated DC-DC converter IC with two switches and the control on one die. The device is capable of 40 V input and 8 A continuous output current. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. The radiation effects are analyzed and possible improvements in the design are given. Since not all transistors of the ATMX150RHA technology were previously tested against radiation, this paper gives more information on the radiation response of this technology.",
keywords = "DC-DC, Hi-Rel, IC, Point-of-Load, rad-hard, radiation, Single Event Effect (SEE), Space, Total Ionizing Dose (TID)",
author = "Philipp Mand and Volodymyr Burkhay and Andre Rocke and Uwe Gieselmann and Leon Fauth and Markus Olbrich and Christophe Delepaut and Bernhard Wicht and Jens Friebe",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 13th European Space Power Conference, ESPC 2023 ; Conference date: 02-10-2023 Through 06-10-2023",
year = "2023",
doi = "10.1109/espc59009.2023.10413247",
language = "English",
isbn = "979-8-3503-2900-1",
booktitle = "2023 13th European Space Power Conference, ESPC 2023",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

Download

TY - GEN

T1 - TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications

AU - Mand, Philipp

AU - Burkhay, Volodymyr

AU - Rocke, Andre

AU - Gieselmann, Uwe

AU - Fauth, Leon

AU - Olbrich, Markus

AU - Delepaut, Christophe

AU - Wicht, Bernhard

AU - Friebe, Jens

N1 - Publisher Copyright: © 2023 IEEE.

PY - 2023

Y1 - 2023

N2 - High-performance applications that require a high output current and a faster transient response increase the need to place the power supply as close as possible to the load. A Point-of-Load converter is specifically designed to meet this requirement. In space, additional reliability criteria such as extended temperature ranges and radiation tolerance are important. In this paper the Total Ionizing Dose and Destructive Single Event Effects on a prototype rad-hard Point-of-Load converter for space applications are evaluated. The device is a fully integrated DC-DC converter IC with two switches and the control on one die. The device is capable of 40 V input and 8 A continuous output current. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. The radiation effects are analyzed and possible improvements in the design are given. Since not all transistors of the ATMX150RHA technology were previously tested against radiation, this paper gives more information on the radiation response of this technology.

AB - High-performance applications that require a high output current and a faster transient response increase the need to place the power supply as close as possible to the load. A Point-of-Load converter is specifically designed to meet this requirement. In space, additional reliability criteria such as extended temperature ranges and radiation tolerance are important. In this paper the Total Ionizing Dose and Destructive Single Event Effects on a prototype rad-hard Point-of-Load converter for space applications are evaluated. The device is a fully integrated DC-DC converter IC with two switches and the control on one die. The device is capable of 40 V input and 8 A continuous output current. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. The radiation effects are analyzed and possible improvements in the design are given. Since not all transistors of the ATMX150RHA technology were previously tested against radiation, this paper gives more information on the radiation response of this technology.

KW - DC-DC

KW - Hi-Rel

KW - IC

KW - Point-of-Load

KW - rad-hard

KW - radiation

KW - Single Event Effect (SEE)

KW - Space

KW - Total Ionizing Dose (TID)

UR - http://www.scopus.com/inward/record.url?scp=85185006818&partnerID=8YFLogxK

U2 - 10.1109/espc59009.2023.10413247

DO - 10.1109/espc59009.2023.10413247

M3 - Conference contribution

AN - SCOPUS:85185006818

SN - 979-8-3503-2900-1

BT - 2023 13th European Space Power Conference, ESPC 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 13th European Space Power Conference, ESPC 2023

Y2 - 2 October 2023 through 6 October 2023

ER -

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