Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 3352-3355 |
| Seitenumfang | 4 |
| Fachzeitschrift | Optics letters |
| Jahrgang | 46 |
| Ausgabenummer | 14 |
| Frühes Online-Datum | 8 Juli 2021 |
| Publikationsstatus | Veröffentlicht - 15 Juli 2021 |
Abstract
Lanthanide-doped nanothermometers are used to measure temperature through changes in their emission characteristic with sensitivities of up to a few %/K. In contrast to their sensitivity, their spatial resolution, which is of critical importance for various applications, has not been thoroughly studied and optimized. We numerically investigated the improvement in spatial resolution of nanothermometers with a stimulated emission depletion microscopy approach. Fundamental relationships between spatial and temperature resolution were identified by using different beam parameters for the excitation and depletion beams. Our simulations predict contactless temperature measurement below the diffraction limit with temperature resolution of ±1.25 K. We further studied the influence of sample thickness and position on both temperature and spatial resolution and showed the potential of three-dimensional measurements.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Atom- und Molekularphysik sowie Optik
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in: Optics letters, Jahrgang 46, Nr. 14, 15.07.2021, S. 3352-3355.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Three-dimensional nanothermometry below the diffraction limit
AU - Thiem, J.
AU - Spelthann, S.
AU - Neumann, J.
AU - Ruehl, A.
AU - Ristau, D.
N1 - Funding Information: Funding. Deutsche Forschungsgemeinschaft (EXC 2122 Project ID 390833453); Niedersächsisches Ministerium für Wissenschaft und Kultur (Quanomet NL5); European Regional Development Fund (ZW 685003502).
PY - 2021/7/15
Y1 - 2021/7/15
N2 - Lanthanide-doped nanothermometers are used to measure temperature through changes in their emission characteristic with sensitivities of up to a few %/K. In contrast to their sensitivity, their spatial resolution, which is of critical importance for various applications, has not been thoroughly studied and optimized. We numerically investigated the improvement in spatial resolution of nanothermometers with a stimulated emission depletion microscopy approach. Fundamental relationships between spatial and temperature resolution were identified by using different beam parameters for the excitation and depletion beams. Our simulations predict contactless temperature measurement below the diffraction limit with temperature resolution of ±1.25 K. We further studied the influence of sample thickness and position on both temperature and spatial resolution and showed the potential of three-dimensional measurements.
AB - Lanthanide-doped nanothermometers are used to measure temperature through changes in their emission characteristic with sensitivities of up to a few %/K. In contrast to their sensitivity, their spatial resolution, which is of critical importance for various applications, has not been thoroughly studied and optimized. We numerically investigated the improvement in spatial resolution of nanothermometers with a stimulated emission depletion microscopy approach. Fundamental relationships between spatial and temperature resolution were identified by using different beam parameters for the excitation and depletion beams. Our simulations predict contactless temperature measurement below the diffraction limit with temperature resolution of ±1.25 K. We further studied the influence of sample thickness and position on both temperature and spatial resolution and showed the potential of three-dimensional measurements.
UR - http://www.scopus.com/inward/record.url?scp=85110145062&partnerID=8YFLogxK
U2 - 10.1364/OL.423626
DO - 10.1364/OL.423626
M3 - Article
C2 - 34264211
AN - SCOPUS:85110145062
VL - 46
SP - 3352
EP - 3355
JO - Optics letters
JF - Optics letters
SN - 0146-9592
IS - 14
ER -