Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 251-253 |
| Seitenumfang | 3 |
| Fachzeitschrift | Physica Status Solidi - Rapid Research Letters |
| Jahrgang | 2 |
| Ausgabenummer | 6 |
| Frühes Online-Datum | 25 Juli 2008 |
| Publikationsstatus | Veröffentlicht - Dez. 2008 |
Abstract
Low fill factors generally limit the efficiency of emitter-wrapthrough (EWT) solar cells. Until now, a conventional series resistance limitation along the laser-drilled EWT vias has usually been assumed to be responsible for this effect. We demonstrate that the characteristic fill factor loss is caused by a crucial change in the diffusion currents inside the base, which are influenced by the conductivity along the laserdrilled EWT vias. In addition, we show that the EWT via conductivity influences the fill factor loss caused by an iron contaminated base. This result affects the proposition that the EWT design is suitable for multicrystalline silicon in which interstitial iron is known to be the main contaminant.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Allgemeine Materialwissenschaften
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
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in: Physica Status Solidi - Rapid Research Letters, Jahrgang 2, Nr. 6, 12.2008, S. 251-253.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - The origin of reduced fill factors of emitter-wrap-through-solar cells
AU - Ulzhöfer, Christian
AU - Hermann, Sonja
AU - Harder, Nils Peter
AU - Altermatt, Pietro P.
AU - Brendel, Rolf
PY - 2008/12
Y1 - 2008/12
N2 - Low fill factors generally limit the efficiency of emitter-wrapthrough (EWT) solar cells. Until now, a conventional series resistance limitation along the laser-drilled EWT vias has usually been assumed to be responsible for this effect. We demonstrate that the characteristic fill factor loss is caused by a crucial change in the diffusion currents inside the base, which are influenced by the conductivity along the laserdrilled EWT vias. In addition, we show that the EWT via conductivity influences the fill factor loss caused by an iron contaminated base. This result affects the proposition that the EWT design is suitable for multicrystalline silicon in which interstitial iron is known to be the main contaminant.
AB - Low fill factors generally limit the efficiency of emitter-wrapthrough (EWT) solar cells. Until now, a conventional series resistance limitation along the laser-drilled EWT vias has usually been assumed to be responsible for this effect. We demonstrate that the characteristic fill factor loss is caused by a crucial change in the diffusion currents inside the base, which are influenced by the conductivity along the laserdrilled EWT vias. In addition, we show that the EWT via conductivity influences the fill factor loss caused by an iron contaminated base. This result affects the proposition that the EWT design is suitable for multicrystalline silicon in which interstitial iron is known to be the main contaminant.
UR - http://www.scopus.com/inward/record.url?scp=66149100683&partnerID=8YFLogxK
U2 - 10.1002/pssr.200802115
DO - 10.1002/pssr.200802115
M3 - Article
AN - SCOPUS:66149100683
VL - 2
SP - 251
EP - 253
JO - Physica Status Solidi - Rapid Research Letters
JF - Physica Status Solidi - Rapid Research Letters
SN - 1862-6254
IS - 6
ER -