The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes

Publikation: Konferenzbeitrag › Paper › Forschung › Peer-Review

Autoren

Manfred Beyer
C. D. Ritschel

Organisationseinheiten

Fachgebiet Hochspannungstechnik und Asset Management (Schering-Institut)

Forschungs-netzwerk anzeigen

Details

Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 1985

Zitieren

The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes. / Beyer , Manfred ; Ritschel, C. D.
1985.

Publikation: Konferenzbeitrag › Paper › Forschung › Peer-Review

Beyer , M & Ritschel, CD 1985, 'The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes'.

Beyer , M., & Ritschel, C. D. (1985). The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes.

Beyer M, Ritschel CD. The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes. 1985.

Beyer , Manfred ; Ritschel, C. D. / The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes.

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