The effect of pseudo-accumulation in the measurement of fatigue laser-induced damage threshold

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • Andrius Melninkaitis
  • Julius Mirauskas
  • Marco Jupé
  • Detlev Ristau
  • Jonathan W. Arenberg
  • Valdas Sirutkaitis

Externe Organisationen

  • Vilnius University
  • Laser Zentrum Hannover e.V. (LZH)
  • Northrop Grumman Corporation
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksLaser-Induced Damage in Optical Materials: 2008
Untertitel40th Annual Boulder Damage Symposium proceedings ; 22 - 24 September 2008, Boulder, Colorado
ErscheinungsortBellingham
Herausgeber (Verlag)SPIE
Seitenumfang1
ISBN (Print)978-0-8194-7366-0
PublikationsstatusVeröffentlicht - 30 Dez. 2008
Extern publiziertJa
Veranstaltung40th Annual Boulder Damage Symposium - Laser-Induced Damage in Optical Materials: 2008 - Boulder, CO, USA / Vereinigte Staaten
Dauer: 22 Sept. 200824 Sept. 2008

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Herausgeber (Verlag)SPIE
Band7132
ISSN (Print)0277-786X

Abstract

Laser-induced damage threshold determination as a function of the number of incident pulses on a specific optic is a classic problem in laser damage studies. There are several models of the fundamental mechanisms explaining the fatigue laser damage behavior including temperature accumulation and changes of electronic or chemical material structure. Herewith we discuss the effects of unstable laser radiation on S-on-1 laser-induced damage probability. Numerical simulations of S-on-1 measurements for specific cases of defect densities, spot sizes and beam jitters are performed. It is demonstrated that the statistical effects of "pseudo-accumulation" reasoned by unstable laser radiation in transparent dielectrics containing nanometer sized defects leads to accumulation-like behavior. The magnitudes of the random beam walking and the energy fluctuations are directly related to the damage probability. Experimental results are also introduced to illustrate the theoretical results.

ASJC Scopus Sachgebiete

Zitieren

The effect of pseudo-accumulation in the measurement of fatigue laser-induced damage threshold. / Melninkaitis, Andrius; Mirauskas, Julius; Jupé, Marco et al.
Laser-Induced Damage in Optical Materials: 2008: 40th Annual Boulder Damage Symposium proceedings ; 22 - 24 September 2008, Boulder, Colorado. Bellingham: SPIE, 2008. 713203 (Proceedings of SPIE - The International Society for Optical Engineering; Band 7132).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Melninkaitis, A, Mirauskas, J, Jupé, M, Ristau, D, Arenberg, JW & Sirutkaitis, V 2008, The effect of pseudo-accumulation in the measurement of fatigue laser-induced damage threshold. in Laser-Induced Damage in Optical Materials: 2008: 40th Annual Boulder Damage Symposium proceedings ; 22 - 24 September 2008, Boulder, Colorado., 713203, Proceedings of SPIE - The International Society for Optical Engineering, Bd. 7132, SPIE, Bellingham, 40th Annual Boulder Damage Symposium - Laser-Induced Damage in Optical Materials: 2008, Boulder, CO, USA / Vereinigte Staaten, 22 Sept. 2008. https://doi.org/10.1117/12.804467
Melninkaitis, A., Mirauskas, J., Jupé, M., Ristau, D., Arenberg, J. W., & Sirutkaitis, V. (2008). The effect of pseudo-accumulation in the measurement of fatigue laser-induced damage threshold. In Laser-Induced Damage in Optical Materials: 2008: 40th Annual Boulder Damage Symposium proceedings ; 22 - 24 September 2008, Boulder, Colorado Artikel 713203 (Proceedings of SPIE - The International Society for Optical Engineering; Band 7132). SPIE. https://doi.org/10.1117/12.804467
Melninkaitis A, Mirauskas J, Jupé M, Ristau D, Arenberg JW, Sirutkaitis V. The effect of pseudo-accumulation in the measurement of fatigue laser-induced damage threshold. in Laser-Induced Damage in Optical Materials: 2008: 40th Annual Boulder Damage Symposium proceedings ; 22 - 24 September 2008, Boulder, Colorado. Bellingham: SPIE. 2008. 713203. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.804467
Melninkaitis, Andrius ; Mirauskas, Julius ; Jupé, Marco et al. / The effect of pseudo-accumulation in the measurement of fatigue laser-induced damage threshold. Laser-Induced Damage in Optical Materials: 2008: 40th Annual Boulder Damage Symposium proceedings ; 22 - 24 September 2008, Boulder, Colorado. Bellingham : SPIE, 2008. (Proceedings of SPIE - The International Society for Optical Engineering).
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AU - Ristau, Detlev

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