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| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 15-22 |
| Fachzeitschrift | International Journal of Information |
| Jahrgang | 6 |
| Ausgabenummer | 2 |
| Publikationsstatus | Veröffentlicht - 2011 |
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The Effect of Additional Information on the Prediction Quality of Wafer Fabrication Operation with a Neural Network and Clustering Approach. / Becker, Matthias.
in: International Journal of Information, Jahrgang 6, Nr. 2, 2011, S. 15-22.
in: International Journal of Information, Jahrgang 6, Nr. 2, 2011, S. 15-22.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung
Becker, M 2011, 'The Effect of Additional Information on the Prediction Quality of Wafer Fabrication Operation with a Neural Network and Clustering Approach', International Journal of Information, Jg. 6, Nr. 2, S. 15-22.
Becker, M. (2011). The Effect of Additional Information on the Prediction Quality of Wafer Fabrication Operation with a Neural Network and Clustering Approach. International Journal of Information, 6(2), 15-22.
Becker M. The Effect of Additional Information on the Prediction Quality of Wafer Fabrication Operation with a Neural Network and Clustering Approach. International Journal of Information. 2011;6(2):15-22.
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author = "Matthias Becker",
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Download
TY - JOUR
T1 - The Effect of Additional Information on the Prediction Quality of Wafer Fabrication Operation with a Neural Network and Clustering Approach
AU - Becker, Matthias
PY - 2011
Y1 - 2011
M3 - Article
VL - 6
SP - 15
EP - 22
JO - International Journal of Information
JF - International Journal of Information
IS - 2
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