Susceptibility of Some Electronic Equipment to HPEM Threats

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Daniel Nitsch
  • Michael Camp
  • Frank Sabath
  • Jan Luiken ter Haseborg
  • Heyno Garbe

Externe Organisationen

  • Wehrwissenschaftliches Institut Für Schutztechnologien - ABC-Schutz (WIS)
  • Technische Universität Hamburg (TUHH)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)380-389
Seitenumfang10
FachzeitschriftIEEE Transactions on Electromagnetic Compatibility
Jahrgang46
Ausgabenummer3
PublikationsstatusVeröffentlicht - 24 Aug. 2004

Abstract

In this paper, an overview of the susceptibility of a large number of different electronic devices like computer networks, computer systems, microprocessor boards, microcontrollers, and other basic integrated circuits (ICs) to different threats like electromagnetic pulse (EMP), ultrawideband (UWB), and high-power microwave pulses (HPM) is given. The presented data will include a comparison of the HPM and UWB susceptibility of some devices and a deeper look into the destruction effects in ICs. Therefore, the ICs were opened and the destruction effects were investigated. A norm based approach to describe the threat of different pulses to electronic devices gives a theoretical explanation for the measured susceptibility data.

ASJC Scopus Sachgebiete

Zitieren

Susceptibility of Some Electronic Equipment to HPEM Threats. / Nitsch, Daniel; Camp, Michael; Sabath, Frank et al.
in: IEEE Transactions on Electromagnetic Compatibility, Jahrgang 46, Nr. 3, 24.08.2004, S. 380-389.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Nitsch D, Camp M, Sabath F, ter Haseborg JL, Garbe H. Susceptibility of Some Electronic Equipment to HPEM Threats. IEEE Transactions on Electromagnetic Compatibility. 2004 Aug 24;46(3):380-389. doi: 10.1109/TEMC.2004.831842
Nitsch, Daniel ; Camp, Michael ; Sabath, Frank et al. / Susceptibility of Some Electronic Equipment to HPEM Threats. in: IEEE Transactions on Electromagnetic Compatibility. 2004 ; Jahrgang 46, Nr. 3. S. 380-389.
Download
@article{be52104b14664da7bacc66c92e09927f,
title = "Susceptibility of Some Electronic Equipment to HPEM Threats",
abstract = "In this paper, an overview of the susceptibility of a large number of different electronic devices like computer networks, computer systems, microprocessor boards, microcontrollers, and other basic integrated circuits (ICs) to different threats like electromagnetic pulse (EMP), ultrawideband (UWB), and high-power microwave pulses (HPM) is given. The presented data will include a comparison of the HPM and UWB susceptibility of some devices and a deeper look into the destruction effects in ICs. Therefore, the ICs were opened and the destruction effects were investigated. A norm based approach to describe the threat of different pulses to electronic devices gives a theoretical explanation for the measured susceptibility data.",
author = "Daniel Nitsch and Michael Camp and Frank Sabath and {ter Haseborg}, {Jan Luiken} and Heyno Garbe",
year = "2004",
month = aug,
day = "24",
doi = "10.1109/TEMC.2004.831842",
language = "English",
volume = "46",
pages = "380--389",
journal = "IEEE Transactions on Electromagnetic Compatibility",
issn = "0018-9375",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "3",

}

Download

TY - JOUR

T1 - Susceptibility of Some Electronic Equipment to HPEM Threats

AU - Nitsch, Daniel

AU - Camp, Michael

AU - Sabath, Frank

AU - ter Haseborg, Jan Luiken

AU - Garbe, Heyno

PY - 2004/8/24

Y1 - 2004/8/24

N2 - In this paper, an overview of the susceptibility of a large number of different electronic devices like computer networks, computer systems, microprocessor boards, microcontrollers, and other basic integrated circuits (ICs) to different threats like electromagnetic pulse (EMP), ultrawideband (UWB), and high-power microwave pulses (HPM) is given. The presented data will include a comparison of the HPM and UWB susceptibility of some devices and a deeper look into the destruction effects in ICs. Therefore, the ICs were opened and the destruction effects were investigated. A norm based approach to describe the threat of different pulses to electronic devices gives a theoretical explanation for the measured susceptibility data.

AB - In this paper, an overview of the susceptibility of a large number of different electronic devices like computer networks, computer systems, microprocessor boards, microcontrollers, and other basic integrated circuits (ICs) to different threats like electromagnetic pulse (EMP), ultrawideband (UWB), and high-power microwave pulses (HPM) is given. The presented data will include a comparison of the HPM and UWB susceptibility of some devices and a deeper look into the destruction effects in ICs. Therefore, the ICs were opened and the destruction effects were investigated. A norm based approach to describe the threat of different pulses to electronic devices gives a theoretical explanation for the measured susceptibility data.

UR - http://www.scopus.com/inward/record.url?scp=4444322745&partnerID=8YFLogxK

U2 - 10.1109/TEMC.2004.831842

DO - 10.1109/TEMC.2004.831842

M3 - Article

AN - SCOPUS:4444322745

VL - 46

SP - 380

EP - 389

JO - IEEE Transactions on Electromagnetic Compatibility

JF - IEEE Transactions on Electromagnetic Compatibility

SN - 0018-9375

IS - 3

ER -