Details
Originalsprache | Englisch |
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Titel des Sammelwerks | Laser-induced damage in optical materials: 2003 |
Untertitel | 35th Annual Boulder Damage Symposium proceedings ; 22 - 24 September 2003, Boulder, Colorado |
Erscheinungsort | Bellingham |
Herausgeber (Verlag) | SPIE |
Seiten | 281-287 |
Seitenumfang | 7 |
ISBN (Print) | 0-8194-5163-0 |
Publikationsstatus | Veröffentlicht - 10 Juni 2004 |
Extern publiziert | Ja |
Veranstaltung | 35th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials 2003 - Boulder, CO, USA / Vereinigte Staaten Dauer: 22 Sept. 2003 → 24 Sept. 2003 |
Publikationsreihe
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Herausgeber (Verlag) | SPIE |
Band | 5273 |
ISSN (Print) | 0277-786X |
Abstract
In the framework of the European research project EUFELE, a set of fluoride and oxide single layer coatings was deposited, irradiated with synchrotron radiation, and subsequently thoroughly characterised. The observed coating damage is strongly related to the spatial distribution of the synchrotron radiation. Therefore, characterisation methods have to be adapted to techniques that are capable to reveal the structural and optical behaviour with adequate spatial resolution. A summary of the radiation damages of oxide materials (SiO2, Al2O3 and HfO2) produced by conventional and sputter deposition techniques, and of fluoride single layers (MgF2, LaF3, AlF3) deposited by thermal evaporation is presented. Degradation was observed within the irradiated areas as well as in the not directly exposed area. The observed degradation effects depend on the surface site. Oxide systems show a superior resistance compared to fluoride coatings. The most sensitive material is Lanthanum fluoride.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
- RIS
Laser-induced damage in optical materials: 2003: 35th Annual Boulder Damage Symposium proceedings ; 22 - 24 September 2003, Boulder, Colorado. Bellingham: SPIE, 2004. S. 281-287 (Proceedings of SPIE - The International Society for Optical Engineering; Band 5273).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Surface investigation of VUV-optical components after exposure to high energetic synchrotron radiation
AU - Günster, Stefan
AU - Blaschke, Holger
AU - Starke, Kai
AU - Ristau, Detlev
AU - Danailov, Miltcho Boyanov
AU - Diviacco, B.
AU - Gatto, Alexandre
AU - Kaiser, Norbert
AU - Sarto, F.
AU - Masetti, E.
PY - 2004/6/10
Y1 - 2004/6/10
N2 - In the framework of the European research project EUFELE, a set of fluoride and oxide single layer coatings was deposited, irradiated with synchrotron radiation, and subsequently thoroughly characterised. The observed coating damage is strongly related to the spatial distribution of the synchrotron radiation. Therefore, characterisation methods have to be adapted to techniques that are capable to reveal the structural and optical behaviour with adequate spatial resolution. A summary of the radiation damages of oxide materials (SiO2, Al2O3 and HfO2) produced by conventional and sputter deposition techniques, and of fluoride single layers (MgF2, LaF3, AlF3) deposited by thermal evaporation is presented. Degradation was observed within the irradiated areas as well as in the not directly exposed area. The observed degradation effects depend on the surface site. Oxide systems show a superior resistance compared to fluoride coatings. The most sensitive material is Lanthanum fluoride.
AB - In the framework of the European research project EUFELE, a set of fluoride and oxide single layer coatings was deposited, irradiated with synchrotron radiation, and subsequently thoroughly characterised. The observed coating damage is strongly related to the spatial distribution of the synchrotron radiation. Therefore, characterisation methods have to be adapted to techniques that are capable to reveal the structural and optical behaviour with adequate spatial resolution. A summary of the radiation damages of oxide materials (SiO2, Al2O3 and HfO2) produced by conventional and sputter deposition techniques, and of fluoride single layers (MgF2, LaF3, AlF3) deposited by thermal evaporation is presented. Degradation was observed within the irradiated areas as well as in the not directly exposed area. The observed degradation effects depend on the surface site. Oxide systems show a superior resistance compared to fluoride coatings. The most sensitive material is Lanthanum fluoride.
KW - Calcium fluoride
KW - Radiation resistance
KW - Spatial resolution
KW - Synchrotron radiation
KW - Vuv characterisation
UR - http://www.scopus.com/inward/record.url?scp=5544284988&partnerID=8YFLogxK
U2 - 10.1117/12.525490
DO - 10.1117/12.525490
M3 - Conference contribution
AN - SCOPUS:5544284988
SN - 0-8194-5163-0
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 281
EP - 287
BT - Laser-induced damage in optical materials: 2003
PB - SPIE
CY - Bellingham
T2 - 35th Annual Boulder Damage Symposium
Y2 - 22 September 2003 through 24 September 2003
ER -