Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 67-72 |
| Seitenumfang | 6 |
| Fachzeitschrift | ULTRAMICROSCOPY |
| Jahrgang | 73 |
| Ausgabenummer | 1-4 |
| Publikationsstatus | Veröffentlicht - 1 Juni 1998 |
| Veranstaltung | 44th International Field Emission Symposium - Tsukuba, Japan Dauer: 7 Juli 1997 → 11 Juli 1997 |
Abstract
An extension of the field-emission current fluctuation method to study surface diffusion on the surface of a field emitter tip is proposed. The present approach is based on an analysis of the local brightness fluctuations extracted from digitized FEM video-images instead of the conventional probe- hole technique. 'Virtual probe-holes' which correspond to probed surface regions of nanometer size can be placed in chosen areas of the image and the integrated intensity in these windows can be monitored with the time resolution of video frames (40 ms in our case). For the Li/Pt[1 0 0](tip) system, the autocorrelation and crosscorrelation analyses of the local FEM brightness fluctuations have been performed. From a comparison of the experimentally obtained and theoretically calculated autocorrelation functions and from the crosscorrelation functions we determine the surface diffusion parameters for Li adatoms on the apex plane of the [1 0 0 ]- oriented Pt field emitter tip.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Atom- und Molekularphysik sowie Optik
- Physik und Astronomie (insg.)
- Instrumentierung
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in: ULTRAMICROSCOPY, Jahrgang 73, Nr. 1-4, 01.06.1998, S. 67-72.
Publikation: Beitrag in Fachzeitschrift › Konferenzaufsatz in Fachzeitschrift › Forschung › Peer-Review
}
TY - JOUR
T1 - Surface diffusion measurements from digitized FEM images
T2 - 44th International Field Emission Symposium
AU - Suchorski, Yu
AU - Beben, J.
AU - Imbihl, R.
N1 - Funding Information: Financial support from the Deutsche Forschungsgemeinschaft is gratefully acknowledged. One of the authors (J.B.) was supported by the MEN (Ref. No. 216/W/IFD/97).
PY - 1998/6/1
Y1 - 1998/6/1
N2 - An extension of the field-emission current fluctuation method to study surface diffusion on the surface of a field emitter tip is proposed. The present approach is based on an analysis of the local brightness fluctuations extracted from digitized FEM video-images instead of the conventional probe- hole technique. 'Virtual probe-holes' which correspond to probed surface regions of nanometer size can be placed in chosen areas of the image and the integrated intensity in these windows can be monitored with the time resolution of video frames (40 ms in our case). For the Li/Pt[1 0 0](tip) system, the autocorrelation and crosscorrelation analyses of the local FEM brightness fluctuations have been performed. From a comparison of the experimentally obtained and theoretically calculated autocorrelation functions and from the crosscorrelation functions we determine the surface diffusion parameters for Li adatoms on the apex plane of the [1 0 0 ]- oriented Pt field emitter tip.
AB - An extension of the field-emission current fluctuation method to study surface diffusion on the surface of a field emitter tip is proposed. The present approach is based on an analysis of the local brightness fluctuations extracted from digitized FEM video-images instead of the conventional probe- hole technique. 'Virtual probe-holes' which correspond to probed surface regions of nanometer size can be placed in chosen areas of the image and the integrated intensity in these windows can be monitored with the time resolution of video frames (40 ms in our case). For the Li/Pt[1 0 0](tip) system, the autocorrelation and crosscorrelation analyses of the local FEM brightness fluctuations have been performed. From a comparison of the experimentally obtained and theoretically calculated autocorrelation functions and from the crosscorrelation functions we determine the surface diffusion parameters for Li adatoms on the apex plane of the [1 0 0 ]- oriented Pt field emitter tip.
UR - http://www.scopus.com/inward/record.url?scp=0032103961&partnerID=8YFLogxK
U2 - 10.1016/S0304-3991(97)00137-X
DO - 10.1016/S0304-3991(97)00137-X
M3 - Conference article
AN - SCOPUS:0032103961
VL - 73
SP - 67
EP - 72
JO - ULTRAMICROSCOPY
JF - ULTRAMICROSCOPY
SN - 0304-3991
IS - 1-4
Y2 - 7 July 1997 through 11 July 1997
ER -