Sub-100 nm structures by neutral atom lithography

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

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  • Universität Konstanz
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Details

OriginalspracheEnglisch
Seiten (von - bis)105-108
Seitenumfang4
FachzeitschriftMicroelectronic Engineering
Jahrgang46
Ausgabenummer1
PublikationsstatusVeröffentlicht - Mai 1999
Extern publiziertJa
Veranstaltung1998 International Conference on Micro- and Nanofabrication (MNE98) - Leuven
Dauer: 22 Sept. 199824 Sept. 1998

Abstract

Instead of using a solid mask to pattern a light beam (optical lithography) we used a mask made of light to pattern a beam of neutral atoms (atom lithography). By making use of two special features of the atom-light interaction we wrote structures with periods below λ/2. In the first approach we inverted the focussing potentials by switching the detuning of the light field during the deposition. The second method uses the fact that atoms with a magnetic substructure in the electronic ground state are strongly sensitive to the polarization of the light field. Both techniques produce sub-100 nm chromium structures in one and two dimensions on silicon substrates.

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Zitieren

Sub-100 nm structures by neutral atom lithography. / Schulze, Th; Brezger, B.; Schmidt, Piet Oliver et al.
in: Microelectronic Engineering, Jahrgang 46, Nr. 1, 05.1999, S. 105-108.

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Schulze, T, Brezger, B, Schmidt, PO, Mertens, R, Bell, AS, Pfau, T & Mlynek, J 1999, 'Sub-100 nm structures by neutral atom lithography', Microelectronic Engineering, Jg. 46, Nr. 1, S. 105-108. https://doi.org/10.1016/S0167-9317(99)00026-X
Schulze, T., Brezger, B., Schmidt, P. O., Mertens, R., Bell, A. S., Pfau, T., & Mlynek, J. (1999). Sub-100 nm structures by neutral atom lithography. Microelectronic Engineering, 46(1), 105-108. https://doi.org/10.1016/S0167-9317(99)00026-X
Schulze T, Brezger B, Schmidt PO, Mertens R, Bell AS, Pfau T et al. Sub-100 nm structures by neutral atom lithography. Microelectronic Engineering. 1999 Mai;46(1):105-108. doi: 10.1016/S0167-9317(99)00026-X
Schulze, Th ; Brezger, B. ; Schmidt, Piet Oliver et al. / Sub-100 nm structures by neutral atom lithography. in: Microelectronic Engineering. 1999 ; Jahrgang 46, Nr. 1. S. 105-108.
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AU - Schulze, Th

AU - Brezger, B.

AU - Schmidt, Piet Oliver

AU - Mertens, R.

AU - Bell, A. S.

AU - Pfau, T.

AU - Mlynek, J.

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Y1 - 1999/5

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T2 - 1998 International Conference on Micro- and Nanofabrication (MNE98)

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