Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Autoren

  • B. Mangote
  • L. Gallais
  • M. Zerrad
  • M. Commandré
  • L. H. Gao
  • F. Lemarchand
  • M. Lequime
  • A. Melninkaitis
  • J. Mirauskas
  • V. Sirutkaitis
  • S. Kicas
  • T. Tolenis
  • R. Drazdys
  • Mathias Mende
  • Lars Jensen
  • Henrik Ehlers
  • Detlev Ristau

Organisationseinheiten

Externe Organisationen

  • Ecole Centrale Marseille
  • Vilnius University
  • Center for Physical Sciences and Technology (FTMC)
  • Laser Zentrum Hannover e.V. (LZH)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksAdvances in Optical Thin Films IV
Herausgeber (Verlag)SPIE
ISBN (Print)9780819487940
PublikationsstatusVeröffentlicht - 4 Okt. 2011
VeranstaltungAdvances in Optical Thin Films IV - Marseille, Frankreich
Dauer: 5 Sept. 2011 → 7 Sept. 2011

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Band8168
ISSN (Print)0277-786X

Abstract

We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al2O3, Nb2O5, HfO2, SiO 2, Ta2O5, ZrO2 deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al2O3/SiO2, Nb 2O5/SiO2, HfO2/SiO2, Ta2O5/SiO2 and ZrO2/SiO2 on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.

ASJC Scopus Sachgebiete

Zitieren

Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. / Mangote, B.; Gallais, L.; Zerrad, M. et al.
Advances in Optical Thin Films IV. SPIE, 2011. 1 (Proceedings of SPIE - The International Society for Optical Engineering; Band 8168).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Mangote, B, Gallais, L, Zerrad, M, Commandré, M, Gao, LH, Lemarchand, F, Lequime, M, Melninkaitis, A, Mirauskas, J, Sirutkaitis, V, Kicas, S, Tolenis, T, Drazdys, R, Mende, M, Jensen, L, Ehlers, H & Ristau, D 2011, Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. in Advances in Optical Thin Films IV., 1, Proceedings of SPIE - The International Society for Optical Engineering, Bd. 8168, SPIE, Advances in Optical Thin Films IV, Marseille, Frankreich, 5 Sept. 2011. https://doi.org/10.1117/12.897372
Mangote, B., Gallais, L., Zerrad, M., Commandré, M., Gao, L. H., Lemarchand, F., Lequime, M., Melninkaitis, A., Mirauskas, J., Sirutkaitis, V., Kicas, S., Tolenis, T., Drazdys, R., Mende, M., Jensen, L., Ehlers, H., & Ristau, D. (2011). Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. In Advances in Optical Thin Films IV Artikel 1 (Proceedings of SPIE - The International Society for Optical Engineering; Band 8168). SPIE. https://doi.org/10.1117/12.897372
Mangote B, Gallais L, Zerrad M, Commandré M, Gao LH, Lemarchand F et al. Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. in Advances in Optical Thin Films IV. SPIE. 2011. 1. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.897372
Mangote, B. ; Gallais, L. ; Zerrad, M. et al. / Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. Advances in Optical Thin Films IV. SPIE, 2011. (Proceedings of SPIE - The International Society for Optical Engineering).
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abstract = "We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al2O3, Nb2O5, HfO2, SiO 2, Ta2O5, ZrO2 deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al2O3/SiO2, Nb 2O5/SiO2, HfO2/SiO2, Ta2O5/SiO2 and ZrO2/SiO2 on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.",
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T1 - Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films

AU - Mangote, B.

AU - Gallais, L.

AU - Zerrad, M.

AU - Commandré, M.

AU - Gao, L. H.

AU - Lemarchand, F.

AU - Lequime, M.

AU - Melninkaitis, A.

AU - Mirauskas, J.

AU - Sirutkaitis, V.

AU - Kicas, S.

AU - Tolenis, T.

AU - Drazdys, R.

AU - Mende, Mathias

AU - Jensen, Lars

AU - Ehlers, Henrik

AU - Ristau, Detlev

PY - 2011/10/4

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N2 - We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al2O3, Nb2O5, HfO2, SiO 2, Ta2O5, ZrO2 deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al2O3/SiO2, Nb 2O5/SiO2, HfO2/SiO2, Ta2O5/SiO2 and ZrO2/SiO2 on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.

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KW - Laser-induced damage

KW - Mixture coatings

KW - Optical coatings

KW - Oxide coatings

KW - Sub-picosecond pulse

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