Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces |
| Untertitel | July 4-7, Saint Etienne, France |
| Herausgeber/-innen | Bengt-Göran Rosén |
| Erscheinungsort | Saint-Etienne |
| Seiten | 49-58 |
| Publikationsstatus | Veröffentlicht - 2005 |
| Veranstaltung | 10th International Conference on Metrology and Properties of Engineering Surfaces - Saint Etienne, Saint Etienne, Frankreich Dauer: 4 Juli 2005 → 7 Juli 2005 Konferenznummer: 10 |
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Structure oriented 3D roughness evaluation with optical profilers. / Weidner, Arnim; Seewig, Jörg; Reithmeier, Eduard.
Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces: July 4-7, Saint Etienne, France. Hrsg. / Bengt-Göran Rosén. Saint-Etienne, 2005. S. 49-58.
Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces: July 4-7, Saint Etienne, France. Hrsg. / Bengt-Göran Rosén. Saint-Etienne, 2005. S. 49-58.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung
Weidner, A, Seewig, J & Reithmeier, E 2005, Structure oriented 3D roughness evaluation with optical profilers. in B-G Rosén (Hrsg.), Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces: July 4-7, Saint Etienne, France. Saint-Etienne, S. 49-58, 10th International Conference on Metrology and Properties of Engineering Surfaces, Saint Etienne, Frankreich, 4 Juli 2005. <https://www.imr.uni-hannover.de/index.php?eID=tx_securedownloads&p=89&u=0&g=0&t=1605682964&hash=85baa6edf727256b2d83f260282d04f1b73722c8&file=/uploads/tx_tkpublikationen/Structure_oriented_3D_roughness_evaluation_with_optical_profilers.pdf>
Weidner, A., Seewig, J., & Reithmeier, E. (2005). Structure oriented 3D roughness evaluation with optical profilers. In B.-G. Rosén (Hrsg.), Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces: July 4-7, Saint Etienne, France (S. 49-58). https://www.imr.uni-hannover.de/index.php?eID=tx_securedownloads&p=89&u=0&g=0&t=1605682964&hash=85baa6edf727256b2d83f260282d04f1b73722c8&file=/uploads/tx_tkpublikationen/Structure_oriented_3D_roughness_evaluation_with_optical_profilers.pdf
Weidner A, Seewig J, Reithmeier E. Structure oriented 3D roughness evaluation with optical profilers. in Rosén BG, Hrsg., Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces: July 4-7, Saint Etienne, France. Saint-Etienne. 2005. S. 49-58
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@inproceedings{70e85683a37746e788ae5ae19a558f21,
title = "Structure oriented 3D roughness evaluation with optical profilers",
author = "Arnim Weidner and J{\"o}rg Seewig and Eduard Reithmeier",
year = "2005",
language = "English",
isbn = "2862723894",
pages = "49--58",
editor = "Bengt-G{\"o}ran Ros{\'e}n",
booktitle = "Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces",
note = "10th International Conference on Metrology and Properties of Engineering Surfaces ; Conference date: 04-07-2005 Through 07-07-2005",
}
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TY - GEN
T1 - Structure oriented 3D roughness evaluation with optical profilers
AU - Weidner, Arnim
AU - Seewig, Jörg
AU - Reithmeier, Eduard
N1 - Conference code: 10
PY - 2005
Y1 - 2005
M3 - Conference contribution
SN - 2862723894
SP - 49
EP - 58
BT - Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces
A2 - Rosén, Bengt-Göran
CY - Saint-Etienne
T2 - 10th International Conference on Metrology and Properties of Engineering Surfaces
Y2 - 4 July 2005 through 7 July 2005
ER -