Strong field double ionization of atoms below the recollision threshold

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Autorschaft

  • Y. Liu
  • A. Rudenko
  • S. Tschuch
  • M. Siegel
  • U. Morgner
  • R. Moshammer
  • J. Ullrich

Organisationseinheiten

Externe Organisationen

  • Max-Planck-Institut für Kernphysik
  • Center for Free-Electron Laser Science (CFEL)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Aufsatznummer032037
FachzeitschriftJournal of Physics: Conference Series
Jahrgang194
Ausgabenummer3
PublikationsstatusVeröffentlicht - 24 Dez. 2009
Veranstaltung26th International Conference on Photonic, Electronic and Atomic Collisions - Kalamazoo, USA / Vereinigte Staaten
Dauer: 22 Juli 200928 Juli 2009

Abstract

Double ionization of Ar and Ne by 45 fs laser pulses (800 nm) has been explored at low intensities where ionization as a result of electron recollision is energetically not possible. We observe a strongly correlated back-to-back emission of the electrons along the polarization direction in striking contrast to all previous data at higher intensities and most calculations.

ASJC Scopus Sachgebiete

Zitieren

Strong field double ionization of atoms below the recollision threshold. / Liu, Y.; Rudenko, A.; Tschuch, S. et al.
in: Journal of Physics: Conference Series, Jahrgang 194, Nr. 3, 032037, 24.12.2009.

Publikation: Beitrag in FachzeitschriftKonferenzaufsatz in FachzeitschriftForschungPeer-Review

Liu, Y, Rudenko, A, Tschuch, S, Siegel, M, Morgner, U, Moshammer, R & Ullrich, J 2009, 'Strong field double ionization of atoms below the recollision threshold', Journal of Physics: Conference Series, Jg. 194, Nr. 3, 032037. https://doi.org/10.1088/1742-6596/194/3/032037
Liu, Y., Rudenko, A., Tschuch, S., Siegel, M., Morgner, U., Moshammer, R., & Ullrich, J. (2009). Strong field double ionization of atoms below the recollision threshold. Journal of Physics: Conference Series, 194(3), Artikel 032037. https://doi.org/10.1088/1742-6596/194/3/032037
Liu Y, Rudenko A, Tschuch S, Siegel M, Morgner U, Moshammer R et al. Strong field double ionization of atoms below the recollision threshold. Journal of Physics: Conference Series. 2009 Dez 24;194(3):032037. doi: 10.1088/1742-6596/194/3/032037
Liu, Y. ; Rudenko, A. ; Tschuch, S. et al. / Strong field double ionization of atoms below the recollision threshold. in: Journal of Physics: Conference Series. 2009 ; Jahrgang 194, Nr. 3.
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AU - Moshammer, R.

AU - Ullrich, J.

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