Details
| Titel in Übersetzung | Dietmar Giselbrecht: Increased sensitivity at near-field measurements on metal housings |
|---|---|
| Originalsprache | Deutsch |
| Titel des Sammelwerks | EMC 2006 |
| Untertitel | International Trade Fair and Conference on Electromagnetic Compatibility |
| Seiten | 245-252 |
| Seitenumfang | 8 |
| Publikationsstatus | Veröffentlicht - 2006 |
| Veranstaltung | International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006 - Düsseldorf, Deutschland Dauer: 7 März 2006 → 9 März 2006 |
Publikationsreihe
| Name | EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility |
|---|
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
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Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. / Reiser, Peter; Garbe, Heyno; Giselbrecht, Dietmar.
EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility. 2006. S. 245-252 (EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility).
EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility. 2006. S. 245-252 (EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
Reiser, P, Garbe, H & Giselbrecht, D 2006, Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. in EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility. EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility, S. 245-252, International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006, Düsseldorf, Deutschland, 7 März 2006.
Reiser, P., Garbe, H., & Giselbrecht, D. (2006). Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. In EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility (S. 245-252). (EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility).
Reiser P, Garbe H, Giselbrecht D. Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. in EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility. 2006. S. 245-252. (EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility).
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title = "Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgeh{\"a}usen",
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year = "2006",
language = "Deutsch",
isbn = "3800729334",
series = "EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility",
pages = "245--252",
booktitle = "EMC 2006",
note = "International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006 ; Conference date: 07-03-2006 Through 09-03-2006",
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T1 - Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen
AU - Reiser, Peter
AU - Garbe, Heyno
AU - Giselbrecht, Dietmar
PY - 2006
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M3 - Aufsatz in Konferenzband
AN - SCOPUS:84881423615
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SN - 9783800729333
T3 - EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility
SP - 245
EP - 252
BT - EMC 2006
T2 - International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006
Y2 - 7 March 2006 through 9 March 2006
ER -