Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • Houssem Abdellatif
  • Bodo Heimann
  • Martin Grotjahn

Organisationseinheiten

Externe Organisationen

  • IAV GmbH
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksProceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference
UntertitelCDC-ECC '05
ErscheinungsortSeville, Spain
Seiten3357-3362
Seitenumfang6
PublikationsstatusVeröffentlicht - 2005
Veranstaltung44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 - Seville, Spanien
Dauer: 12 Dez. 200515 Dez. 2005

Abstract

The problem of high measurement noise in identification issue is treated in this paper for an innovative parallel robotic manipulator. To consider the noise and the correlation across the system's output a complete statistical approach is presented. The Maximum-Likelihood estimator is used for the identification of the dynamics parameters. Furthermore the experiments were designed based on a statistical criterion, such that the resulting excitation trajectories minimize the uncertainty bounds of the estimation. The experimental results are consequently compared with those resulting from classic deterministic approaches. This comparison demonstrates that the presented methodology yields bias-free and asymptotic efficient estimation.

ASJC Scopus Sachgebiete

Zitieren

Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise. / Abdellatif, Houssem; Heimann, Bodo; Grotjahn, Martin.
Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference: CDC-ECC '05. Seville, Spain, 2005. S. 3357-3362 1582680.

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Abdellatif, H, Heimann, B & Grotjahn, M 2005, Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise. in Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference: CDC-ECC '05., 1582680, Seville, Spain, S. 3357-3362, 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05, Seville, Spanien, 12 Dez. 2005. https://doi.org/10.1109/CDC.2005.1582680
Abdellatif, H., Heimann, B., & Grotjahn, M. (2005). Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise. In Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference: CDC-ECC '05 (S. 3357-3362). Artikel 1582680. https://doi.org/10.1109/CDC.2005.1582680
Abdellatif H, Heimann B, Grotjahn M. Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise. in Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference: CDC-ECC '05. Seville, Spain. 2005. S. 3357-3362. 1582680 doi: 10.1109/CDC.2005.1582680
Abdellatif, Houssem ; Heimann, Bodo ; Grotjahn, Martin. / Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise. Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference: CDC-ECC '05. Seville, Spain, 2005. S. 3357-3362
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