Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | Laser-Induced Damage in Optical Materials |
| Untertitel | 2002 and 7th International Workshop on Laser Beam and Optics Characterization |
| Erscheinungsort | Bellingham |
| Herausgeber (Verlag) | SPIE |
| Seiten | 482-491 |
| Seitenumfang | 10 |
| ISBN (Print) | 0-8194-4727-7 |
| Publikationsstatus | Veröffentlicht - 30 Mai 2003 |
| Extern publiziert | Ja |
| Veranstaltung | Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization - Boulder, CO, USA / Vereinigte Staaten Dauer: 16 Sept. 2002 → 18 Sept. 2002 |
Publikationsreihe
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Herausgeber (Verlag) | SPIE |
| Band | 4932 |
| ISSN (Print) | 0277-786X |
Abstract
Ultra-short pulse laser systems are considered as promising tools in the fields of precise micro-machining and medicine applications. In the course of the development of reliable table top laser systems, a rapid growth of ultra-short pulse applications could be observed during the recent years. The key for improving the performance of high power laser systems is the quality of the optical components concerning spectral characteristics, optical losses and the power handling capability. In the field of ultra-short pulses, standard measurement procedures in quality management have to be validated in respect to effects induced by the extremely high peak power densities. The present work, which is embedded in the EUREKA-project CHOCLAB II, is predominantly concentrated on measuring the multiple-pulse LIDT (ISO 11254-2) in the fs-regime. A measurement facility based on a Ti:Sapphire-CPA system was developed to investigate the damage behavior of optical components. The set-up was supplied with an improved pulse energy detector discriminating the influence of pulse-to-pulse energy fluctuations on the incidence of damage. Additionally, a laser-calorimetric measurement facility determining the absorption (ISO 11551) utilizing a fs-Ti:Sapphire laser was accomplished. The investigation for different pulse durations between 130 fs and 1 ps revealed a drastic increase of absorption in titania coatings for ultra-short pulses.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
- RIS
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. Bellingham: SPIE, 2003. S. 482-491 (Proceedings of SPIE - The International Society for Optical Engineering; Band 4932).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Standard measurement procedures for the characterization of fs-laser optical components
AU - Starke, Kai
AU - Ristau, Detlev
AU - Welling, Herbert
PY - 2003/5/30
Y1 - 2003/5/30
N2 - Ultra-short pulse laser systems are considered as promising tools in the fields of precise micro-machining and medicine applications. In the course of the development of reliable table top laser systems, a rapid growth of ultra-short pulse applications could be observed during the recent years. The key for improving the performance of high power laser systems is the quality of the optical components concerning spectral characteristics, optical losses and the power handling capability. In the field of ultra-short pulses, standard measurement procedures in quality management have to be validated in respect to effects induced by the extremely high peak power densities. The present work, which is embedded in the EUREKA-project CHOCLAB II, is predominantly concentrated on measuring the multiple-pulse LIDT (ISO 11254-2) in the fs-regime. A measurement facility based on a Ti:Sapphire-CPA system was developed to investigate the damage behavior of optical components. The set-up was supplied with an improved pulse energy detector discriminating the influence of pulse-to-pulse energy fluctuations on the incidence of damage. Additionally, a laser-calorimetric measurement facility determining the absorption (ISO 11551) utilizing a fs-Ti:Sapphire laser was accomplished. The investigation for different pulse durations between 130 fs and 1 ps revealed a drastic increase of absorption in titania coatings for ultra-short pulses.
AB - Ultra-short pulse laser systems are considered as promising tools in the fields of precise micro-machining and medicine applications. In the course of the development of reliable table top laser systems, a rapid growth of ultra-short pulse applications could be observed during the recent years. The key for improving the performance of high power laser systems is the quality of the optical components concerning spectral characteristics, optical losses and the power handling capability. In the field of ultra-short pulses, standard measurement procedures in quality management have to be validated in respect to effects induced by the extremely high peak power densities. The present work, which is embedded in the EUREKA-project CHOCLAB II, is predominantly concentrated on measuring the multiple-pulse LIDT (ISO 11254-2) in the fs-regime. A measurement facility based on a Ti:Sapphire-CPA system was developed to investigate the damage behavior of optical components. The set-up was supplied with an improved pulse energy detector discriminating the influence of pulse-to-pulse energy fluctuations on the incidence of damage. Additionally, a laser-calorimetric measurement facility determining the absorption (ISO 11551) utilizing a fs-Ti:Sapphire laser was accomplished. The investigation for different pulse durations between 130 fs and 1 ps revealed a drastic increase of absorption in titania coatings for ultra-short pulses.
KW - Absorptance
KW - Fs-pulses
KW - Multi-photon ionization
KW - Multiple-pulse damage threshold
KW - Optical losses
KW - S-on-1 LIDT
KW - Ultra-short pulses
UR - http://www.scopus.com/inward/record.url?scp=0041860997&partnerID=8YFLogxK
U2 - 10.1117/12.472383
DO - 10.1117/12.472383
M3 - Conference contribution
AN - SCOPUS:0041860997
SN - 0-8194-4727-7
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 482
EP - 491
BT - Laser-Induced Damage in Optical Materials
PB - SPIE
CY - Bellingham
T2 - Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Y2 - 16 September 2002 through 18 September 2002
ER -