Details
| Originalsprache | undefiniert/unbekannt |
|---|---|
| Fachzeitschrift | Surface review and letters |
| Publikationsstatus | Veröffentlicht - 1996 |
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Size-selective measurements of silicon-cluster polarizabilities by a cluster-beam deflection technique. / Woenckhaus, J.; Schäfer, R.; Becker, J.A.
in: Surface review and letters, 1996.
in: Surface review and letters, 1996.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
Woenckhaus J, Schäfer R, Becker JA. Size-selective measurements of silicon-cluster polarizabilities by a cluster-beam deflection technique. Surface review and letters. 1996. doi: 10.1142/S0218625X9600067X
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AU - Becker, J.A.
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