Size-dependent analysis of the metal-insulator transition in the integral quantum hall effect

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  • Max-Planck-Institut für Festkörperforschung
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OriginalspracheEnglisch
Seiten (von - bis)883-886
Seitenumfang4
FachzeitschriftPhysical review letters
Jahrgang67
Ausgabenummer7
PublikationsstatusVeröffentlicht - 1 Jan. 1991
Extern publiziertJa

Abstract

The critical exponent of the localization length in the integral quantum Hall regime can be measured directly using the Hall-bar geometries with different sizes. We obtain a universal behavior for the three lowest Landau levels. This is in agreement with the universality prediction of the field-theoretic approach to the metal-insulator transition in the quantum Hall effect. The value of =2.30.1 agrees with recent numerical studies for the lowest Landau level. The measured value of the temperature exponent of the inelastic-scattering rate is found to range from p=2.70.3 to p=3.40.4.

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Size-dependent analysis of the metal-insulator transition in the integral quantum hall effect. / Koch, S.; Haug, R. J.; Klitzing, K. V. et al.
in: Physical review letters, Jahrgang 67, Nr. 7, 01.01.1991, S. 883-886.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Koch S, Haug RJ, Klitzing KV, Ploog K. Size-dependent analysis of the metal-insulator transition in the integral quantum hall effect. Physical review letters. 1991 Jan 1;67(7):883-886. doi: 10.1103/PhysRevLett.67.883
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