Details
| Originalsprache | Englisch |
|---|---|
| Aufsatznummer | 5446379 |
| Seiten (von - bis) | 766-777 |
| Seitenumfang | 12 |
| Fachzeitschrift | IEEE Transactions on Electromagnetic Compatibility |
| Jahrgang | 52 |
| Ausgabenummer | 4 |
| Publikationsstatus | Veröffentlicht - 12 Apr. 2010 |
Abstract
We illustrate the use of the reverberation chamber to simulate fixed wireless propagation environments including effects such as narrowband fading and Doppler spread. These effects have a strong impact on the quality of the wireless channel and the ability of a receiver to decode a digitally modulated signal. Different channel characteristics such as power delay profile and RMS delay spread are varied inside the chamber by incorporating various amounts of absorbing material. In order to illustrate the impact of the chamber configuration on the quality of a wireless communication channel, bit error rate measurements are performed inside the reverberation chamber for different loadings, symbol rates, and paddle speeds; the results are discussed. Measured results acquired inside a chamber are compared with those obtained both in an actual industrial environment and in an office.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Atom- und Molekularphysik sowie Optik
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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in: IEEE Transactions on Electromagnetic Compatibility, Jahrgang 52, Nr. 4, 5446379, 12.04.2010, S. 766-777.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Simulating the Multipath Channel With a Reverberation Chamber
T2 - Application to Bit Error Rate Measurements
AU - Genender, Evgeni
AU - Holloway, Christopher L.
AU - Remley, Kate A.
AU - Ladbury, John M.
AU - Koepke, Galen
AU - Garbe, Heyno
PY - 2010/4/12
Y1 - 2010/4/12
N2 - We illustrate the use of the reverberation chamber to simulate fixed wireless propagation environments including effects such as narrowband fading and Doppler spread. These effects have a strong impact on the quality of the wireless channel and the ability of a receiver to decode a digitally modulated signal. Different channel characteristics such as power delay profile and RMS delay spread are varied inside the chamber by incorporating various amounts of absorbing material. In order to illustrate the impact of the chamber configuration on the quality of a wireless communication channel, bit error rate measurements are performed inside the reverberation chamber for different loadings, symbol rates, and paddle speeds; the results are discussed. Measured results acquired inside a chamber are compared with those obtained both in an actual industrial environment and in an office.
AB - We illustrate the use of the reverberation chamber to simulate fixed wireless propagation environments including effects such as narrowband fading and Doppler spread. These effects have a strong impact on the quality of the wireless channel and the ability of a receiver to decode a digitally modulated signal. Different channel characteristics such as power delay profile and RMS delay spread are varied inside the chamber by incorporating various amounts of absorbing material. In order to illustrate the impact of the chamber configuration on the quality of a wireless communication channel, bit error rate measurements are performed inside the reverberation chamber for different loadings, symbol rates, and paddle speeds; the results are discussed. Measured results acquired inside a chamber are compared with those obtained both in an actual industrial environment and in an office.
KW - Bit error rate (BER)
KW - digital modulation
KW - multipath
KW - reverberation chamber
KW - wireless
KW - wireless propagation
UR - http://www.scopus.com/inward/record.url?scp=78649328167&partnerID=8YFLogxK
U2 - 10.1109/TEMC.2010.2044578
DO - 10.1109/TEMC.2010.2044578
M3 - Article
AN - SCOPUS:78649328167
VL - 52
SP - 766
EP - 777
JO - IEEE Transactions on Electromagnetic Compatibility
JF - IEEE Transactions on Electromagnetic Compatibility
SN - 0018-9375
IS - 4
M1 - 5446379
ER -