Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | Proceedings of the 25th International Conference on the Physics of Semiconductors Part I |
| Seiten | 1743-1744 |
| Band | 1 |
| Publikationsstatus | Veröffentlicht - 2001 |
| Veranstaltung | 25th International Conference on the Physics of Semiconductors - Osaka, Japan Dauer: 17 Sept. 2000 → 22 Sept. 2000 |
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Scanning probe nanolithography - Direct fabrication of mesoscopic devices. / Keyser, U. F.; Schumacher, H. W.; Zeitler, U. et al.
Proceedings of the 25th International Conference on the Physics of Semiconductors Part I. Band 1 2001. S. 1743-1744.
Proceedings of the 25th International Conference on the Physics of Semiconductors Part I. Band 1 2001. S. 1743-1744.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung
Keyser, UF, Schumacher, HW, Zeitler, U, Haug, RJ & Eberl, K 2001, Scanning probe nanolithography - Direct fabrication of mesoscopic devices. in Proceedings of the 25th International Conference on the Physics of Semiconductors Part I. Bd. 1, S. 1743-1744, 25th International Conference on the Physics of Semiconductors, Osaka, Japan, 17 Sept. 2000. <https://www.google.com/url?sa=t&rct=j&q=&esrc=s&source=web&cd=&ved=2ahUKEwjU4Orz6OryAhXiS_EDHQkZD04QFnoECAMQAQ&url=https%3A%2F%2Fwww.hfml.ru.nl%2Fzeitler%2Fpubli%2Fpdf%2F49_ICPS_UliK.pdf&usg=AOvVaw1g9Jh5GUcHxnrVab1Laczu>
Keyser, U. F., Schumacher, H. W., Zeitler, U., Haug, R. J., & Eberl, K. (2001). Scanning probe nanolithography - Direct fabrication of mesoscopic devices. In Proceedings of the 25th International Conference on the Physics of Semiconductors Part I (Band 1, S. 1743-1744) https://www.google.com/url?sa=t&rct=j&q=&esrc=s&source=web&cd=&ved=2ahUKEwjU4Orz6OryAhXiS_EDHQkZD04QFnoECAMQAQ&url=https%3A%2F%2Fwww.hfml.ru.nl%2Fzeitler%2Fpubli%2Fpdf%2F49_ICPS_UliK.pdf&usg=AOvVaw1g9Jh5GUcHxnrVab1Laczu
Keyser UF, Schumacher HW, Zeitler U, Haug RJ, Eberl K. Scanning probe nanolithography - Direct fabrication of mesoscopic devices. in Proceedings of the 25th International Conference on the Physics of Semiconductors Part I. Band 1. 2001. S. 1743-1744
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@inproceedings{a14b654f11a94d11a6f0d52e63b0e2e5,
title = "Scanning probe nanolithography - Direct fabrication of mesoscopic devices",
author = "Keyser, {U. F.} and Schumacher, {H. W.} and U. Zeitler and Haug, {R. J.} and K. Eberl",
year = "2001",
language = "English",
isbn = "978-3-540-41778-1",
volume = "1",
pages = "1743--1744",
booktitle = "Proceedings of the 25th International Conference on the Physics of Semiconductors Part I",
note = "25th International Conference on the Physics of Semiconductors ; Conference date: 17-09-2000 Through 22-09-2000",
}
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TY - GEN
T1 - Scanning probe nanolithography - Direct fabrication of mesoscopic devices
AU - Keyser, U. F.
AU - Schumacher, H. W.
AU - Zeitler, U.
AU - Haug, R. J.
AU - Eberl, K.
PY - 2001
Y1 - 2001
M3 - Conference contribution
SN - 978-3-540-41778-1
SN - 978-3-642-63993-7
VL - 1
SP - 1743
EP - 1744
BT - Proceedings of the 25th International Conference on the Physics of Semiconductors Part I
T2 - 25th International Conference on the Physics of Semiconductors
Y2 - 17 September 2000 through 22 September 2000
ER -