Scaling of femtosecond laser induced breakdown threshold in Ti xSi1-xO2 composite films

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Autoren

  • Igor V. Cravetchi
  • Duy N. Nguyen
  • Wolfgang G. Rudolph
  • Marco Jupé
  • Marc Lappschies
  • Kai Starke
  • D.etlev Ristau

Externe Organisationen

  • University of New Mexico
  • Laser Zentrum Hannover e.V. (LZH)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des Sammelwerks2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference, CLEO
PublikationsstatusVeröffentlicht - 2007
Extern publiziertJa
Veranstaltung2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference, CLEO - Munich, Deutschland
Dauer: 17 Juni 2007 → 22 Juni 2007

Publikationsreihe

NameConference on Lasers and Electro-Optics Europe - Technical Digest

ASJC Scopus Sachgebiete

Zitieren

Scaling of femtosecond laser induced breakdown threshold in Ti xSi1-xO2 composite films. / Cravetchi, Igor V.; Nguyen, Duy N.; Rudolph, Wolfgang G. et al.
2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference, CLEO. 2007. 4386682 (Conference on Lasers and Electro-Optics Europe - Technical Digest).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review

Cravetchi, IV, Nguyen, DN, Rudolph, WG, Jupé, M, Lappschies, M, Starke, K & Ristau, DE 2007, Scaling of femtosecond laser induced breakdown threshold in Ti xSi1-xO2 composite films. in 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference, CLEO., 4386682, Conference on Lasers and Electro-Optics Europe - Technical Digest, 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference, CLEO, Munich, Deutschland, 17 Juni 2007. https://doi.org/10.1109/CLEOE-IQEC.2007.4386682
Cravetchi, I. V., Nguyen, D. N., Rudolph, W. G., Jupé, M., Lappschies, M., Starke, K., & Ristau, D. E. (2007). Scaling of femtosecond laser induced breakdown threshold in Ti xSi1-xO2 composite films. In 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference, CLEO Artikel 4386682 (Conference on Lasers and Electro-Optics Europe - Technical Digest). https://doi.org/10.1109/CLEOE-IQEC.2007.4386682
Cravetchi IV, Nguyen DN, Rudolph WG, Jupé M, Lappschies M, Starke K et al. Scaling of femtosecond laser induced breakdown threshold in Ti xSi1-xO2 composite films. in 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference, CLEO. 2007. 4386682. (Conference on Lasers and Electro-Optics Europe - Technical Digest). doi: 10.1109/CLEOE-IQEC.2007.4386682
Cravetchi, Igor V. ; Nguyen, Duy N. ; Rudolph, Wolfgang G. et al. / Scaling of femtosecond laser induced breakdown threshold in Ti xSi1-xO2 composite films. 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference, CLEO. 2007. (Conference on Lasers and Electro-Optics Europe - Technical Digest).
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author = "Cravetchi, {Igor V.} and Nguyen, {Duy N.} and Rudolph, {Wolfgang G.} and Marco Jup{\'e} and Marc Lappschies and Kai Starke and D.etlev Ristau",
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AU - Cravetchi, Igor V.

AU - Nguyen, Duy N.

AU - Rudolph, Wolfgang G.

AU - Jupé, Marco

AU - Lappschies, Marc

AU - Starke, Kai

AU - Ristau, D.etlev

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