Robustness validation of integrated circuits and systems

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • M. Barke
  • M. Kärgel
  • W. Lu
  • F. Salfelder
  • L. Hedrich
  • M. Olbrich
  • M. Radetzki
  • U. Schlichtmann

Externe Organisationen

  • Technische Universität München (TUM)
  • Universität Stuttgart
  • Goethe-Universität Frankfurt am Main
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksProceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012
Seiten145-154
Seitenumfang10
PublikationsstatusVeröffentlicht - 2012
Veranstaltung4th Asia Symposium on Quality Electronic Design, ASQED 2012 - Penang, Malaysia
Dauer: 10 Juli 201211 Juli 2012

Publikationsreihe

NameProceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012

Abstract

Robust system design is becoming increasingly important, because of the ongoing miniaturization of integrated circuits, the increasing effects of aging mechanisms, and the effects of parasitic elements, both intrinsic and external. For safety reasons, particular emphasis is placed on robust system design in the automotive and aerospace sectors. Until now, the term robustness has been applied very intuitively and there has been no proper way to actually measure robustness. However, the complexity of contemporary systems makes it difficult to fulfill tight specifications. For this reason, robustness must be integrated into a partially automated design flow. In this paper, a new approach to robustness modeling is presented, in addition to new ways to quantify or assess the robustness of a design. To demonstrate the flexibility of the proposed approach, it is adapted and applied to several different scenarios. These include the robustness evaluation of digital circuits under aging effects, such as NBTI; the robustness modeling of analog and mixed signal circuits using affine arithmetic; and the robustness study of software algorithms on a high system level.

ASJC Scopus Sachgebiete

Zitieren

Robustness validation of integrated circuits and systems. / Barke, M.; Kärgel, M.; Lu, W. et al.
Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012. 2012. S. 145-154 6320491 (Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Barke, M, Kärgel, M, Lu, W, Salfelder, F, Hedrich, L, Olbrich, M, Radetzki, M & Schlichtmann, U 2012, Robustness validation of integrated circuits and systems. in Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012., 6320491, Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012, S. 145-154, 4th Asia Symposium on Quality Electronic Design, ASQED 2012, Penang, Malaysia, 10 Juli 2012. https://doi.org/10.1109/ACQED.2012.6320491
Barke, M., Kärgel, M., Lu, W., Salfelder, F., Hedrich, L., Olbrich, M., Radetzki, M., & Schlichtmann, U. (2012). Robustness validation of integrated circuits and systems. In Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012 (S. 145-154). Artikel 6320491 (Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012). https://doi.org/10.1109/ACQED.2012.6320491
Barke M, Kärgel M, Lu W, Salfelder F, Hedrich L, Olbrich M et al. Robustness validation of integrated circuits and systems. in Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012. 2012. S. 145-154. 6320491. (Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012). doi: 10.1109/ACQED.2012.6320491
Barke, M. ; Kärgel, M. ; Lu, W. et al. / Robustness validation of integrated circuits and systems. Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012. 2012. S. 145-154 (Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012).
Download
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