Robustness measurement of integrated circuits and its adaptation to aging effects.

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Autoren

  • Martin Barke
  • Michael Kärgel
  • Markus Olbrich
  • Ulf Schlichtmann

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Details

Originalspracheundefiniert/unbekannt
Seiten (von - bis)1058-1065
FachzeitschriftMicroelectron. Reliab.
Jahrgang54
Ausgabenummer6-7
PublikationsstatusVeröffentlicht - 2014

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Robustness measurement of integrated circuits and its adaptation to aging effects. / Barke, Martin; Kärgel, Michael; Olbrich, Markus et al.
in: Microelectron. Reliab., Jahrgang 54, Nr. 6-7, 2014, S. 1058-1065.

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Barke M, Kärgel M, Olbrich M, Schlichtmann U. Robustness measurement of integrated circuits and its adaptation to aging effects. Microelectron. Reliab. 2014;54(6-7):1058-1065. doi: 10.1016/J.MICROREL.2014.01.012
Barke, Martin ; Kärgel, Michael ; Olbrich, Markus et al. / Robustness measurement of integrated circuits and its adaptation to aging effects. in: Microelectron. Reliab. 2014 ; Jahrgang 54, Nr. 6-7. S. 1058-1065.
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