Robust direct vision-based pose tracking using normalized mutual information

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OriginalspracheEnglisch
Titel des SammelwerksOptical Metrology and Inspection for Industrial Applications V
Herausgeber/-innenToru Yoshizawa, Song Zhang, Sen Han, Sen Han
Herausgeber (Verlag)SPIE
Seitenumfang13
ISBN (elektronisch)9781510622364
PublikationsstatusVeröffentlicht - 2 Nov. 2018
VeranstaltungOptical Metrology and Inspection for Industrial Applications V 2018 - Beijing, China
Dauer: 11 Okt. 201813 Okt. 2018

Publikationsreihe

NameProceedings of SPIE - The International Society for Optical Engineering
Band10819
ISSN (Print)0277-786X
ISSN (elektronisch)1996-756X

Abstract

This paper presents a novel visual tracking approach that combines the NMI metric and the traditional SSD metric within a gradient-based optimization frame, which can be used for direct visual odometry and SLAM. We firstly derivate the closed form expression for first- and second-order analytical NMI derivatives under the assumption of rigid-body transformations, which then can be used by subsequent Newton-like optimization methods. Then we develop a robust tracking scheme that utilizes the robustness of NMI metric while keeping the optimization characteristics of SSD-based Lucas-Kanade (LK) tracking methods. To validate the robustness and accuracy of the proposed approach, several experiments are performed on synthetic datasets as well as real image datasets. The experimental results demonstrate that our approach can provide fast, accurate pose estimation and obtain better tracking performance over standard SSD-based methods in most cases.

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Robust direct vision-based pose tracking using normalized mutual information. / Luo, Hang; Pape, Christian; Reithmeier, Eduard.
Optical Metrology and Inspection for Industrial Applications V. Hrsg. / Toru Yoshizawa; Song Zhang; Sen Han; Sen Han. SPIE, 2018. 108190T (Proceedings of SPIE - The International Society for Optical Engineering; Band 10819).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Luo, H, Pape, C & Reithmeier, E 2018, Robust direct vision-based pose tracking using normalized mutual information. in T Yoshizawa, S Zhang, S Han & S Han (Hrsg.), Optical Metrology and Inspection for Industrial Applications V., 108190T, Proceedings of SPIE - The International Society for Optical Engineering, Bd. 10819, SPIE, Optical Metrology and Inspection for Industrial Applications V 2018, Beijing, China, 11 Okt. 2018. https://doi.org/10.1117/12.2500857, https://doi.org/10.15488/10272
Luo, H., Pape, C., & Reithmeier, E. (2018). Robust direct vision-based pose tracking using normalized mutual information. In T. Yoshizawa, S. Zhang, S. Han, & S. Han (Hrsg.), Optical Metrology and Inspection for Industrial Applications V Artikel 108190T (Proceedings of SPIE - The International Society for Optical Engineering; Band 10819). SPIE. https://doi.org/10.1117/12.2500857, https://doi.org/10.15488/10272
Luo H, Pape C, Reithmeier E. Robust direct vision-based pose tracking using normalized mutual information. in Yoshizawa T, Zhang S, Han S, Han S, Hrsg., Optical Metrology and Inspection for Industrial Applications V. SPIE. 2018. 108190T. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2500857, 10.15488/10272
Luo, Hang ; Pape, Christian ; Reithmeier, Eduard. / Robust direct vision-based pose tracking using normalized mutual information. Optical Metrology and Inspection for Industrial Applications V. Hrsg. / Toru Yoshizawa ; Song Zhang ; Sen Han ; Sen Han. SPIE, 2018. (Proceedings of SPIE - The International Society for Optical Engineering).
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