Details
Originalsprache | Englisch |
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Titel des Sammelwerks | 2009 IEEE International Symposium on Electromagnetic Compatibility |
Untertitel | EMC |
Seiten | 226-231 |
Seitenumfang | 6 |
Publikationsstatus | Veröffentlicht - 2009 |
Veranstaltung | 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 - Austin, USA / Vereinigte Staaten Dauer: 17 Aug. 2009 → 21 Aug. 2009 |
Publikationsreihe
Name | IEEE International Symposium on Electromagnetic Compatibility |
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ISSN (Print) | 1077-4076 |
Abstract
High-Power Electromagnetic (HPEM) environments are capable of causing effects like malfunctions, performance degradation, interferences, and destructions in electronic and electrical systems. This paper will discuss the risk potential of different HPEM environments for electronic systems. In addition to wellknown characteristics of HPEM environments aspects like mobility, ability to access the target and likelihood of occurrence will be taken into consideration.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
- RIS
2009 IEEE International Symposium on Electromagnetic Compatibility: EMC. 2009. S. 226-231 5284566 (IEEE International Symposium on Electromagnetic Compatibility).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Risk Potential of Radiated HPEM Environments
AU - Sabath, Frank
AU - Garbe, Heyno
PY - 2009
Y1 - 2009
N2 - High-Power Electromagnetic (HPEM) environments are capable of causing effects like malfunctions, performance degradation, interferences, and destructions in electronic and electrical systems. This paper will discuss the risk potential of different HPEM environments for electronic systems. In addition to wellknown characteristics of HPEM environments aspects like mobility, ability to access the target and likelihood of occurrence will be taken into consideration.
AB - High-Power Electromagnetic (HPEM) environments are capable of causing effects like malfunctions, performance degradation, interferences, and destructions in electronic and electrical systems. This paper will discuss the risk potential of different HPEM environments for electronic systems. In addition to wellknown characteristics of HPEM environments aspects like mobility, ability to access the target and likelihood of occurrence will be taken into consideration.
UR - http://www.scopus.com/inward/record.url?scp=74349121368&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2009.5284566
DO - 10.1109/ISEMC.2009.5284566
M3 - Conference contribution
AN - SCOPUS:74349121368
SN - 9781424442676
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 226
EP - 231
BT - 2009 IEEE International Symposium on Electromagnetic Compatibility
T2 - 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
Y2 - 17 August 2009 through 21 August 2009
ER -