Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | Defect and Diffusion Forum |
| Seiten | 61-67 |
| Seitenumfang | 7 |
| Publikationsstatus | Veröffentlicht - 20 Okt. 2020 |
| Veranstaltung | 14th International Conference on THE A Coatings, 2020 - Nuremberg, Deutschland Dauer: 19 Nov. 2020 → 20 Nov. 2020 |
Publikationsreihe
| Name | Defect and Diffusion Forum |
|---|---|
| Band | 404 |
| ISSN (Print) | 1012-0386 |
| ISSN (elektronisch) | 1662-9507 |
Abstract
Residual stress measurements directly in the coated cutting edge are not possible with Xray diffraction (XRD) due to the diameter of the X-ray beam. On the other hand, Raman microscopy enables measurements on the micrometer scale. Parameter variations in the PVD process were used to provide different residual stress states in (Al,Ti)N coatings on carbide cutting tools. They were examined by XRD in regions that can be reliably measured. The same area was then examined by Raman microscopy to determine the relationship of Raman peaks to the residual stress. Local highresolution Raman measurements were then taken at the cutting edge and further influences on the Raman peak position besides residual stresses were excluded. In order to analyze the relationship between Raman peak shift and residual stress state, measurements were performed during a bending load. Finally, an outlook on further investigations is given.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Strahlung
- Werkstoffwissenschaften (insg.)
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
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Defect and Diffusion Forum. 2020. S. 61-67 (Defect and Diffusion Forum; Band 404).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Residual Stress Measurements in PVD Coatings of Carbide Cutting Tools Directly in the Cutting Edge
AU - Breidenstein, Bernd
AU - Vogel, Nils
AU - Dietrich, Marcel
AU - Behrens, Harald
AU - Andersson, Jon M.
PY - 2020/10/20
Y1 - 2020/10/20
N2 - Residual stress measurements directly in the coated cutting edge are not possible with Xray diffraction (XRD) due to the diameter of the X-ray beam. On the other hand, Raman microscopy enables measurements on the micrometer scale. Parameter variations in the PVD process were used to provide different residual stress states in (Al,Ti)N coatings on carbide cutting tools. They were examined by XRD in regions that can be reliably measured. The same area was then examined by Raman microscopy to determine the relationship of Raman peaks to the residual stress. Local highresolution Raman measurements were then taken at the cutting edge and further influences on the Raman peak position besides residual stresses were excluded. In order to analyze the relationship between Raman peak shift and residual stress state, measurements were performed during a bending load. Finally, an outlook on further investigations is given.
AB - Residual stress measurements directly in the coated cutting edge are not possible with Xray diffraction (XRD) due to the diameter of the X-ray beam. On the other hand, Raman microscopy enables measurements on the micrometer scale. Parameter variations in the PVD process were used to provide different residual stress states in (Al,Ti)N coatings on carbide cutting tools. They were examined by XRD in regions that can be reliably measured. The same area was then examined by Raman microscopy to determine the relationship of Raman peaks to the residual stress. Local highresolution Raman measurements were then taken at the cutting edge and further influences on the Raman peak position besides residual stresses were excluded. In order to analyze the relationship between Raman peak shift and residual stress state, measurements were performed during a bending load. Finally, an outlook on further investigations is given.
KW - Cutting edge
KW - PVD-coating
KW - Residual stress
UR - http://www.scopus.com/inward/record.url?scp=85096423671&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/DDF.404.61
DO - 10.4028/www.scientific.net/DDF.404.61
M3 - Conference contribution
AN - SCOPUS:85096423671
T3 - Defect and Diffusion Forum
SP - 61
EP - 67
BT - Defect and Diffusion Forum
T2 - 14th International Conference on THE A Coatings, 2020
Y2 - 19 November 2020 through 20 November 2020
ER -