Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2013 15th European Conference on Power Electronics and Applications, EPE 2013 |
| Publikationsstatus | Veröffentlicht - 2013 |
| Veranstaltung | 2013 15th European Conference on Power Electronics and Applications, EPE 2013 - Lille, Frankreich Dauer: 2 Sept. 2013 → 6 Sept. 2013 |
Publikationsreihe
| Name | 2013 15th European Conference on Power Electronics and Applications, EPE 2013 |
|---|
Abstract
The reliability of discrete power semiconductor packages is getting more and more important in regard to the increasing number of power applications in the low power range. Therefore it is necessary to get more information and details on reliability of discrete packages and systems by performing reliability tests as well as simulations. In this paper the chosen approach and first results of simulations and tests are described on D2Pak and CanPAK systems as often used discrete power semiconductor packages.
ASJC Scopus Sachgebiete
- Energie (insg.)
- Energieanlagenbau und Kraftwerkstechnik
- Energie (insg.)
- Feuerungstechnik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
Zitieren
- Standard
- Harvard
- Apa
- Vancouver
- BibTex
- RIS
2013 15th European Conference on Power Electronics and Applications, EPE 2013. 2013. 6634611 (2013 15th European Conference on Power Electronics and Applications, EPE 2013).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Reliability of discrete power semiconductor packages and systems - D2Pak and CanPAK in comparison
AU - Hofmann, Kay
AU - Herold, Christian
AU - Beier, Menia
AU - Lutz, Josef
AU - Friebe, Jens
N1 - Copyright: Copyright 2014 Elsevier B.V., All rights reserved.
PY - 2013
Y1 - 2013
N2 - The reliability of discrete power semiconductor packages is getting more and more important in regard to the increasing number of power applications in the low power range. Therefore it is necessary to get more information and details on reliability of discrete packages and systems by performing reliability tests as well as simulations. In this paper the chosen approach and first results of simulations and tests are described on D2Pak and CanPAK systems as often used discrete power semiconductor packages.
AB - The reliability of discrete power semiconductor packages is getting more and more important in regard to the increasing number of power applications in the low power range. Therefore it is necessary to get more information and details on reliability of discrete packages and systems by performing reliability tests as well as simulations. In this paper the chosen approach and first results of simulations and tests are described on D2Pak and CanPAK systems as often used discrete power semiconductor packages.
KW - Discrete power device
KW - Packaging
KW - Power cycling
KW - Reliability
UR - http://www.scopus.com/inward/record.url?scp=84890244658&partnerID=8YFLogxK
U2 - 10.1109/EPE.2013.6634611
DO - 10.1109/EPE.2013.6634611
M3 - Conference contribution
AN - SCOPUS:84890244658
SN - 9781479901166
T3 - 2013 15th European Conference on Power Electronics and Applications, EPE 2013
BT - 2013 15th European Conference on Power Electronics and Applications, EPE 2013
T2 - 2013 15th European Conference on Power Electronics and Applications, EPE 2013
Y2 - 2 September 2013 through 6 September 2013
ER -