Recombination at local aluminum-alloyed silicon solar cell base contacts by dynamic infrared lifetime mapping

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Jens Müller
  • Karsten Bothe
  • Sebastian Gatz
  • Heiko Plagwitz
  • Gunnar Schubert
  • Rolf Brendel

Organisationseinheiten

Externe Organisationen

  • Institut für Solarenergieforschung GmbH (ISFH)
  • Sunways AG
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Details

OriginalspracheEnglisch
Seiten (von - bis)337-342
Seitenumfang6
FachzeitschriftEnergy Procedia
Jahrgang8
Frühes Online-Datum12 Aug. 2011
PublikationsstatusVeröffentlicht - 2011

Abstract

The application of local aluminum (Al)-alloyed contacts to the p-type base of silicon solar cells reduces minority charge carrier recombination due to the formation of a local back surface field (LBSF). We study the recombination properties and formation of base contacts, which are realized by local laser ablation of a dielectric stack (laser contact opening - LCO) and subsequent full area screen printing of Al paste. Based on charge carrier lifetime measurements using the camera-based and calibration-free dynamic infrared lifetime mapping (ILM) technique, we determine contact recombination velocities at the contacts as low as Scont = 65 cm/s on 200 Ωcm float-zone silicon (FZ-Si) and corresponding reverse saturation current densities of J0,cont = 900 fA/cm2 on 1.5 Ωcm FZ-Si. As a result we show that local contact geometries with point contact radii r > 100 μm and line contact widths a > 80 μm are appropriate for lowest contact recombination employing local Al alloyed contacts. Furthermore, complete and high quality laser ablation of the dielectric stack is necessary for the formation of a sufficiently thick LBSF.

ASJC Scopus Sachgebiete

Zitieren

Recombination at local aluminum-alloyed silicon solar cell base contacts by dynamic infrared lifetime mapping. / Müller, Jens; Bothe, Karsten; Gatz, Sebastian et al.
in: Energy Procedia, Jahrgang 8, 2011, S. 337-342.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Müller J, Bothe K, Gatz S, Plagwitz H, Schubert G, Brendel R. Recombination at local aluminum-alloyed silicon solar cell base contacts by dynamic infrared lifetime mapping. Energy Procedia. 2011;8:337-342. Epub 2011 Aug 12. doi: 10.1016/j.egypro.2011.06.146, 10.15488/1156
Müller, Jens ; Bothe, Karsten ; Gatz, Sebastian et al. / Recombination at local aluminum-alloyed silicon solar cell base contacts by dynamic infrared lifetime mapping. in: Energy Procedia. 2011 ; Jahrgang 8. S. 337-342.
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@article{c2cf73d2715f4a04a4ba953ef641cb07,
title = "Recombination at local aluminum-alloyed silicon solar cell base contacts by dynamic infrared lifetime mapping",
abstract = "The application of local aluminum (Al)-alloyed contacts to the p-type base of silicon solar cells reduces minority charge carrier recombination due to the formation of a local back surface field (LBSF). We study the recombination properties and formation of base contacts, which are realized by local laser ablation of a dielectric stack (laser contact opening - LCO) and subsequent full area screen printing of Al paste. Based on charge carrier lifetime measurements using the camera-based and calibration-free dynamic infrared lifetime mapping (ILM) technique, we determine contact recombination velocities at the contacts as low as Scont = 65 cm/s on 200 Ωcm float-zone silicon (FZ-Si) and corresponding reverse saturation current densities of J0,cont = 900 fA/cm2 on 1.5 Ωcm FZ-Si. As a result we show that local contact geometries with point contact radii r > 100 μm and line contact widths a > 80 μm are appropriate for lowest contact recombination employing local Al alloyed contacts. Furthermore, complete and high quality laser ablation of the dielectric stack is necessary for the formation of a sufficiently thick LBSF.",
keywords = "Carrier lifetime, Laser ablation, Local back surface field, Silicon solar cells",
author = "Jens M{\"u}ller and Karsten Bothe and Sebastian Gatz and Heiko Plagwitz and Gunnar Schubert and Rolf Brendel",
year = "2011",
doi = "10.1016/j.egypro.2011.06.146",
language = "English",
volume = "8",
pages = "337--342",

}

Download

TY - JOUR

T1 - Recombination at local aluminum-alloyed silicon solar cell base contacts by dynamic infrared lifetime mapping

AU - Müller, Jens

AU - Bothe, Karsten

AU - Gatz, Sebastian

AU - Plagwitz, Heiko

AU - Schubert, Gunnar

AU - Brendel, Rolf

PY - 2011

Y1 - 2011

N2 - The application of local aluminum (Al)-alloyed contacts to the p-type base of silicon solar cells reduces minority charge carrier recombination due to the formation of a local back surface field (LBSF). We study the recombination properties and formation of base contacts, which are realized by local laser ablation of a dielectric stack (laser contact opening - LCO) and subsequent full area screen printing of Al paste. Based on charge carrier lifetime measurements using the camera-based and calibration-free dynamic infrared lifetime mapping (ILM) technique, we determine contact recombination velocities at the contacts as low as Scont = 65 cm/s on 200 Ωcm float-zone silicon (FZ-Si) and corresponding reverse saturation current densities of J0,cont = 900 fA/cm2 on 1.5 Ωcm FZ-Si. As a result we show that local contact geometries with point contact radii r > 100 μm and line contact widths a > 80 μm are appropriate for lowest contact recombination employing local Al alloyed contacts. Furthermore, complete and high quality laser ablation of the dielectric stack is necessary for the formation of a sufficiently thick LBSF.

AB - The application of local aluminum (Al)-alloyed contacts to the p-type base of silicon solar cells reduces minority charge carrier recombination due to the formation of a local back surface field (LBSF). We study the recombination properties and formation of base contacts, which are realized by local laser ablation of a dielectric stack (laser contact opening - LCO) and subsequent full area screen printing of Al paste. Based on charge carrier lifetime measurements using the camera-based and calibration-free dynamic infrared lifetime mapping (ILM) technique, we determine contact recombination velocities at the contacts as low as Scont = 65 cm/s on 200 Ωcm float-zone silicon (FZ-Si) and corresponding reverse saturation current densities of J0,cont = 900 fA/cm2 on 1.5 Ωcm FZ-Si. As a result we show that local contact geometries with point contact radii r > 100 μm and line contact widths a > 80 μm are appropriate for lowest contact recombination employing local Al alloyed contacts. Furthermore, complete and high quality laser ablation of the dielectric stack is necessary for the formation of a sufficiently thick LBSF.

KW - Carrier lifetime

KW - Laser ablation

KW - Local back surface field

KW - Silicon solar cells

UR - http://www.scopus.com/inward/record.url?scp=80052103778&partnerID=8YFLogxK

U2 - 10.1016/j.egypro.2011.06.146

DO - 10.1016/j.egypro.2011.06.146

M3 - Article

AN - SCOPUS:80052103778

VL - 8

SP - 337

EP - 342

JO - Energy Procedia

JF - Energy Procedia

SN - 1876-6102

ER -