Quantum calibrated magnetic force microscopy

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Autoren

  • Baha Sakar
  • Yan Liu
  • Sibylle Sievers
  • Volker Neu
  • Johannes Lang
  • Christian Osterkamp
  • Matthew L. Markham
  • Osman Öztürk
  • Fedor Jelezko
  • Hans W. Schumacher

Externe Organisationen

  • Physikalisch-Technische Bundesanstalt (PTB)
  • Gebze Technical University
  • Beijing Academy of Quantum Information Sciences (BAQIS)
  • Universität Ulm
  • Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden (IFW) e.V.
  • Element Six Global Innovation Centre (GIC)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Aufsatznummer214427
FachzeitschriftPhysical Review B
Jahrgang104
Ausgabenummer21
PublikationsstatusVeröffentlicht - 1 Dez. 2021
Extern publiziertJa

Abstract

We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray-field distribution of the MFM tip using a single nitrogen vacancy (NV) center in diamond. From the measured stray-field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images to quantum calibrated stray-field maps. This approach overcomes limitations of prior MFM calibration schemes and allows quantum calibrated nanoscale stray-field measurements in a field range inaccessible to scanning NV magnetometry. Quantum calibrated measurements of a stray-field reference sample allow its use as a transfer standard, opening the road towards fast and easily accessible quantum traceable calibrations of virtually any MFM.

ASJC Scopus Sachgebiete

Zitieren

Quantum calibrated magnetic force microscopy. / Sakar, Baha; Liu, Yan; Sievers, Sibylle et al.
in: Physical Review B, Jahrgang 104, Nr. 21, 214427, 01.12.2021.

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Sakar, B, Liu, Y, Sievers, S, Neu, V, Lang, J, Osterkamp, C, Markham, ML, Öztürk, O, Jelezko, F & Schumacher, HW 2021, 'Quantum calibrated magnetic force microscopy', Physical Review B, Jg. 104, Nr. 21, 214427. https://doi.org/10.1103/PhysRevB.104.214427
Sakar, B., Liu, Y., Sievers, S., Neu, V., Lang, J., Osterkamp, C., Markham, M. L., Öztürk, O., Jelezko, F., & Schumacher, H. W. (2021). Quantum calibrated magnetic force microscopy. Physical Review B, 104(21), Artikel 214427. https://doi.org/10.1103/PhysRevB.104.214427
Sakar B, Liu Y, Sievers S, Neu V, Lang J, Osterkamp C et al. Quantum calibrated magnetic force microscopy. Physical Review B. 2021 Dez 1;104(21):214427. doi: 10.1103/PhysRevB.104.214427
Sakar, Baha ; Liu, Yan ; Sievers, Sibylle et al. / Quantum calibrated magnetic force microscopy. in: Physical Review B. 2021 ; Jahrgang 104, Nr. 21.
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abstract = "We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray-field distribution of the MFM tip using a single nitrogen vacancy (NV) center in diamond. From the measured stray-field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images to quantum calibrated stray-field maps. This approach overcomes limitations of prior MFM calibration schemes and allows quantum calibrated nanoscale stray-field measurements in a field range inaccessible to scanning NV magnetometry. Quantum calibrated measurements of a stray-field reference sample allow its use as a transfer standard, opening the road towards fast and easily accessible quantum traceable calibrations of virtually any MFM.",
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AU - Neu, Volker

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AU - Öztürk, Osman

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