Quality control of oblique incidence optical coatings based on normal incidence measurement data

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Autoren

  • Tatiana V. Amotchkina
  • Michael K. Trubetskov
  • Alexander V. Tikhonravov
  • Sebastian Schlichting
  • Henrik Ehlers
  • Detlev Ristau
  • David Death
  • Robert J. Francis
  • Vladimir Pervak

Organisationseinheiten

Externe Organisationen

  • Lomonosov Moscow State University
  • Max-Planck-Institut für Quantenoptik (MPQ)
  • Laser Zentrum Hannover e.V. (LZH)
  • Agilent Technologies
  • Ludwig-Maximilians-Universität München (LMU)
  • Ultrafast Innovations GmbH
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Seiten (von - bis)21508-21522
Seitenumfang15
FachzeitschriftOptics Express
Jahrgang21
Ausgabenummer18
PublikationsstatusVeröffentlicht - 9 Sept. 2013

Abstract

We demonstrate selection of reliable approaches for postproduction characterization of oblique incidence multilayer optical coatings. The approaches include choice of input information, selection of adequate coating model, corresponding numerical characterization algorithm, and verification of the results. Applications of the approaches are illustrated with post-production characterization of oblique incidence edge filter, oblique incidence beam splitter and oblique incidence 43-layer quarter-wave mirror.

ASJC Scopus Sachgebiete

Zitieren

Quality control of oblique incidence optical coatings based on normal incidence measurement data. / Amotchkina, Tatiana V.; Trubetskov, Michael K.; Tikhonravov, Alexander V. et al.
in: Optics Express, Jahrgang 21, Nr. 18, 09.09.2013, S. 21508-21522.

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review

Amotchkina, TV, Trubetskov, MK, Tikhonravov, AV, Schlichting, S, Ehlers, H, Ristau, D, Death, D, Francis, RJ & Pervak, V 2013, 'Quality control of oblique incidence optical coatings based on normal incidence measurement data', Optics Express, Jg. 21, Nr. 18, S. 21508-21522. https://doi.org/10.1364/OE.21.021508
Amotchkina, T. V., Trubetskov, M. K., Tikhonravov, A. V., Schlichting, S., Ehlers, H., Ristau, D., Death, D., Francis, R. J., & Pervak, V. (2013). Quality control of oblique incidence optical coatings based on normal incidence measurement data. Optics Express, 21(18), 21508-21522. https://doi.org/10.1364/OE.21.021508
Amotchkina TV, Trubetskov MK, Tikhonravov AV, Schlichting S, Ehlers H, Ristau D et al. Quality control of oblique incidence optical coatings based on normal incidence measurement data. Optics Express. 2013 Sep 9;21(18):21508-21522. doi: 10.1364/OE.21.021508
Amotchkina, Tatiana V. ; Trubetskov, Michael K. ; Tikhonravov, Alexander V. et al. / Quality control of oblique incidence optical coatings based on normal incidence measurement data. in: Optics Express. 2013 ; Jahrgang 21, Nr. 18. S. 21508-21522.
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