Process tomography of ion trap quantum gates

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • M. Riebe
  • K. Kim
  • P. Schindler
  • T. Monz
  • Piet Oliver Schmidt
  • T. K. Körber
  • W. Hänsel
  • H. Häffner
  • C. F. Roos
  • R. Blatt

Externe Organisationen

  • Universität Innsbruck
  • Austrian Academy of Sciences
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Details

OriginalspracheEnglisch
Aufsatznummer220407
FachzeitschriftPhysical Review Letters
Jahrgang97
Ausgabenummer22
PublikationsstatusVeröffentlicht - 1 Dez. 2006
Extern publiziertJa

Abstract

A crucial building block for quantum information processing with trapped ions is a controlled-NOT quantum gate. In this Letter, two different sequences of laser pulses implementing such a gate operation are analyzed using quantum process tomography. Fidelities of up to 92.6(6)% are achieved for single-gate operations and up to 83.4(8)% for two concatenated gate operations. By process tomography we assess the performance of the gates for different experimental realizations and demonstrate the advantage of amplitude-shaped laser pulses over simple square pulses. We also investigate whether the performance of concatenated gates can be inferred from the analysis of the single gates.

ASJC Scopus Sachgebiete

Zitieren

Process tomography of ion trap quantum gates. / Riebe, M.; Kim, K.; Schindler, P. et al.
in: Physical Review Letters, Jahrgang 97, Nr. 22, 220407, 01.12.2006.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Riebe, M, Kim, K, Schindler, P, Monz, T, Schmidt, PO, Körber, TK, Hänsel, W, Häffner, H, Roos, CF & Blatt, R 2006, 'Process tomography of ion trap quantum gates', Physical Review Letters, Jg. 97, Nr. 22, 220407. https://doi.org/10.1103/PhysRevLett.97.220407
Riebe, M., Kim, K., Schindler, P., Monz, T., Schmidt, P. O., Körber, T. K., Hänsel, W., Häffner, H., Roos, C. F., & Blatt, R. (2006). Process tomography of ion trap quantum gates. Physical Review Letters, 97(22), Artikel 220407. https://doi.org/10.1103/PhysRevLett.97.220407
Riebe M, Kim K, Schindler P, Monz T, Schmidt PO, Körber TK et al. Process tomography of ion trap quantum gates. Physical Review Letters. 2006 Dez 1;97(22):220407. doi: 10.1103/PhysRevLett.97.220407
Riebe, M. ; Kim, K. ; Schindler, P. et al. / Process tomography of ion trap quantum gates. in: Physical Review Letters. 2006 ; Jahrgang 97, Nr. 22.
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