Preprocessing of 3D Measurement Data of Microstructures with Large Lateral Dimension

Details

Originalsprache	Englisch
Titel des Sammelwerks	Focus on Microscopy 2010; Shanghai, China
Seiten	155
Seitenumfang	1
Publikationsstatus	Veröffentlicht - 2010

Preprocessing of 3D Measurement Data of Microstructures with Large Lateral Dimension. / Bretschneider, Martin; Kästner, Markus; Reithmeier, Eduard.
Focus on Microscopy 2010; Shanghai, China. 2010. S. 155.

Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Abstract in Konferenzband › Forschung

Bretschneider, Martin ; Kästner, Markus ; Reithmeier, Eduard. / Preprocessing of 3D Measurement Data of Microstructures with Large Lateral Dimension. Focus on Microscopy 2010; Shanghai, China. 2010. S. 155

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