Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 334-340 |
| Seitenumfang | 7 |
| Fachzeitschrift | Spectrochimica Acta - Part B Atomic Spectroscopy |
| Jahrgang | 64 |
| Ausgabenummer | 4 |
| Frühes Online-Datum | 20 März 2009 |
| Publikationsstatus | Elektronisch veröffentlicht (E-Pub) - 20 März 2009 |
Abstract
For the validation of the quantification of the newly-developed method of 3D Micro X-ray fluorescence spectroscopy (3D Micro-XRF) samples with a low average Z matrix and minor high Z elements are best suited. In a light matrix the interferences by matrix effects are minimized so that organic polymers are appropriate as basis for analytes which are more easily detected by X-ray fluorescence spectroscopy. Polymer layer systems were assembled from single layers of ethylene-propylene-diene rubber (EPDM) filled with changing concentrations of silica and zinc oxide as inorganic additives. Layer thicknesses were in the range of 30-150 μm. Before the analysis with 3D Micro-XRF all layers have been characterized by scanning micro-XRF with regard to filler dispersion, by infrared microscopy and light microscopy in order to determine the layer thicknesses and by ICP-OES to verify the concentration of the X-ray sensitive elements in the layers. With the results obtained for stacked polymer systems the validity of the analytical quantification model for the determination of stratified materials by 3D Micro-XRF could be demonstrated.
ASJC Scopus Sachgebiete
- Chemie (insg.)
- Analytische Chemie
- Physik und Astronomie (insg.)
- Atom- und Molekularphysik sowie Optik
- Physik und Astronomie (insg.)
- Instrumentierung
- Chemie (insg.)
- Spektroskopie
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in: Spectrochimica Acta - Part B Atomic Spectroscopy, Jahrgang 64, Nr. 4, 20.03.2009, S. 334-340.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Preparation and characterization of polymer layer systems for validation of 3D Micro X-ray fluorescence spectroscopy
AU - Schaumann, Ina
AU - Malzer, Wolfgang
AU - Mantouvalou, Ioanna
AU - Lühl, Lars
AU - Kanngießer, Birgit
AU - Dargel, Rainer
AU - Giese, Ulrich
AU - Vogt, Carla
PY - 2009/3/20
Y1 - 2009/3/20
N2 - For the validation of the quantification of the newly-developed method of 3D Micro X-ray fluorescence spectroscopy (3D Micro-XRF) samples with a low average Z matrix and minor high Z elements are best suited. In a light matrix the interferences by matrix effects are minimized so that organic polymers are appropriate as basis for analytes which are more easily detected by X-ray fluorescence spectroscopy. Polymer layer systems were assembled from single layers of ethylene-propylene-diene rubber (EPDM) filled with changing concentrations of silica and zinc oxide as inorganic additives. Layer thicknesses were in the range of 30-150 μm. Before the analysis with 3D Micro-XRF all layers have been characterized by scanning micro-XRF with regard to filler dispersion, by infrared microscopy and light microscopy in order to determine the layer thicknesses and by ICP-OES to verify the concentration of the X-ray sensitive elements in the layers. With the results obtained for stacked polymer systems the validity of the analytical quantification model for the determination of stratified materials by 3D Micro-XRF could be demonstrated.
AB - For the validation of the quantification of the newly-developed method of 3D Micro X-ray fluorescence spectroscopy (3D Micro-XRF) samples with a low average Z matrix and minor high Z elements are best suited. In a light matrix the interferences by matrix effects are minimized so that organic polymers are appropriate as basis for analytes which are more easily detected by X-ray fluorescence spectroscopy. Polymer layer systems were assembled from single layers of ethylene-propylene-diene rubber (EPDM) filled with changing concentrations of silica and zinc oxide as inorganic additives. Layer thicknesses were in the range of 30-150 μm. Before the analysis with 3D Micro-XRF all layers have been characterized by scanning micro-XRF with regard to filler dispersion, by infrared microscopy and light microscopy in order to determine the layer thicknesses and by ICP-OES to verify the concentration of the X-ray sensitive elements in the layers. With the results obtained for stacked polymer systems the validity of the analytical quantification model for the determination of stratified materials by 3D Micro-XRF could be demonstrated.
KW - 3D X-ray fluorescence spectroscopy
KW - Inorganic fillers in organic matrix
KW - Polymer multilayer systems
UR - http://www.scopus.com/inward/record.url?scp=67349264063&partnerID=8YFLogxK
U2 - 10.1016/j.sab.2009.03.004
DO - 10.1016/j.sab.2009.03.004
M3 - Article
AN - SCOPUS:67349264063
VL - 64
SP - 334
EP - 340
JO - Spectrochimica Acta - Part B Atomic Spectroscopy
JF - Spectrochimica Acta - Part B Atomic Spectroscopy
SN - 0584-8547
IS - 4
ER -