Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2015 Asia-Pacific International Symposium on Electromagnetic Compatibility |
| Untertitel | APEMC |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seiten | 456-459 |
| Seitenumfang | 4 |
| ISBN (elektronisch) | 9781479966707 |
| Publikationsstatus | Veröffentlicht - 2015 |
| Veranstaltung | Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 - Taipei, Taiwan Dauer: 25 Mai 2015 → 29 Mai 2015 |
Abstract
The measurement procedures to determine the maximum emissions of electronic devices are described in different standards by CISPR. However, these standards only account for testing the equipment under test (EUT) while assuming that the engineer knows the direction corresponding to the highest level of emission. But, electronic devices act as unintentional radiators. This means that it is not possible to know the direction of maximum emission a priori without performing a complete 3-dimensional scan which is very time-consuming. In this paper, a stochastic approach for the maximum directivity of unintentional radiators is used to predict the maximum emissions from reduced sampling assumptions. This approach is applied to the simulation results of a generic EUT by the use of the software FEKO.
ASJC Scopus Sachgebiete
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
- Physik und Astronomie (insg.)
- Strahlung
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2015 Asia-Pacific International Symposium on Electromagnetic Compatibility: APEMC. Institute of Electrical and Electronics Engineers Inc., 2015. S. 456-459 7175289.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Predicting the Maximum Radiated Electric Field Strength From Unintentional Radiators
AU - Menssen, Benjamin
AU - Hamann, David
AU - Garbe, Heyno
PY - 2015
Y1 - 2015
N2 - The measurement procedures to determine the maximum emissions of electronic devices are described in different standards by CISPR. However, these standards only account for testing the equipment under test (EUT) while assuming that the engineer knows the direction corresponding to the highest level of emission. But, electronic devices act as unintentional radiators. This means that it is not possible to know the direction of maximum emission a priori without performing a complete 3-dimensional scan which is very time-consuming. In this paper, a stochastic approach for the maximum directivity of unintentional radiators is used to predict the maximum emissions from reduced sampling assumptions. This approach is applied to the simulation results of a generic EUT by the use of the software FEKO.
AB - The measurement procedures to determine the maximum emissions of electronic devices are described in different standards by CISPR. However, these standards only account for testing the equipment under test (EUT) while assuming that the engineer knows the direction corresponding to the highest level of emission. But, electronic devices act as unintentional radiators. This means that it is not possible to know the direction of maximum emission a priori without performing a complete 3-dimensional scan which is very time-consuming. In this paper, a stochastic approach for the maximum directivity of unintentional radiators is used to predict the maximum emissions from reduced sampling assumptions. This approach is applied to the simulation results of a generic EUT by the use of the software FEKO.
KW - electrical size
KW - emission measurement
KW - maximum directivity
KW - prediction
KW - simulation
KW - unintentional radiator
UR - http://www.scopus.com/inward/record.url?scp=84964005733&partnerID=8YFLogxK
U2 - 10.1109/APEMC.2015.7175289
DO - 10.1109/APEMC.2015.7175289
M3 - Conference contribution
AN - SCOPUS:84964005733
SP - 456
EP - 459
BT - 2015 Asia-Pacific International Symposium on Electromagnetic Compatibility
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015
Y2 - 25 May 2015 through 29 May 2015
ER -