Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 368-379 |
| Seitenumfang | 12 |
| Fachzeitschrift | IEEE Transactions on Electromagnetic Compatibility |
| Jahrgang | 46 |
| Ausgabenummer | 3 |
| Publikationsstatus | Veröffentlicht - 24 Aug. 2004 |
Abstract
Reproducible prediction of damaging effects is one of the main problems in intentional electromagnetic interference (IEMI). In this paper, the susceptibility of different types of single microcontrollers to unipolar fast rise time pulses [electromagnetic pulse (EMP), ultrawide band (UWB)] is determined. Therefore, pulses with rise times as fast as 100 ps and electric field amplitude of up to 100 kV/m are applied to the devices. The results are generalized with a novel statistical procedure. Following discussion and rationale, the Weibull distribution is selected to describe the interference behavior. The statistical analysis provides a new test procedure for a confident determination of the interference behavior parameters.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Atom- und Molekularphysik sowie Optik
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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in: IEEE Transactions on Electromagnetic Compatibility, Jahrgang 46, Nr. 3, 24.08.2004, S. 368-379.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Predicting the Breakdown Behavior of Microcontrollers Under EMP/UWB Impact Using a Statistical Analysis
AU - Camp, Michael
AU - Gerth, Hendrik
AU - Garbe, Heyno
AU - Haase, Helmut
N1 - Funding Information: Manuscript received July 14, 2003; revised March 1, 2004. This work was supported in part by the German Federal Office of Defense Technology and Procurement under Contract E/E590/Y5140. The authors are with the Institute for Electrical Engineering and Measurement Science, University of Hannover, D-30167 Hannover, Germany (e-mail: camp@ieee.org). Digital Object Identifier 10.1109/TEMC.2004.831816
PY - 2004/8/24
Y1 - 2004/8/24
N2 - Reproducible prediction of damaging effects is one of the main problems in intentional electromagnetic interference (IEMI). In this paper, the susceptibility of different types of single microcontrollers to unipolar fast rise time pulses [electromagnetic pulse (EMP), ultrawide band (UWB)] is determined. Therefore, pulses with rise times as fast as 100 ps and electric field amplitude of up to 100 kV/m are applied to the devices. The results are generalized with a novel statistical procedure. Following discussion and rationale, the Weibull distribution is selected to describe the interference behavior. The statistical analysis provides a new test procedure for a confident determination of the interference behavior parameters.
AB - Reproducible prediction of damaging effects is one of the main problems in intentional electromagnetic interference (IEMI). In this paper, the susceptibility of different types of single microcontrollers to unipolar fast rise time pulses [electromagnetic pulse (EMP), ultrawide band (UWB)] is determined. Therefore, pulses with rise times as fast as 100 ps and electric field amplitude of up to 100 kV/m are applied to the devices. The results are generalized with a novel statistical procedure. Following discussion and rationale, the Weibull distribution is selected to describe the interference behavior. The statistical analysis provides a new test procedure for a confident determination of the interference behavior parameters.
UR - http://www.scopus.com/inward/record.url?scp=4444275609&partnerID=8YFLogxK
U2 - 10.1109/TEMC.2004.831816
DO - 10.1109/TEMC.2004.831816
M3 - Article
AN - SCOPUS:4444275609
VL - 46
SP - 368
EP - 379
JO - IEEE Transactions on Electromagnetic Compatibility
JF - IEEE Transactions on Electromagnetic Compatibility
SN - 0018-9375
IS - 3
ER -