Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 319-328 |
| Seitenumfang | 10 |
| Fachzeitschrift | Crystal research and technology |
| Jahrgang | 34 |
| Ausgabenummer | 3 |
| Publikationsstatus | Veröffentlicht - 16 Apr. 1999 |
Abstract
An analytical model for a Skull melting set-up is presented, which describes the power absorption in the melt and the losses in the inductor coil and the cold crucible. A strong dependence of the relative size of these quantities on the applied frequency has been found. Above a characteristic frequency, where the skin depth equals about one half of the melt radius, only a small percentage of the overall power (typically 10% for oxide melts) is lost in the copper coil and the crucible. Below this frequency, the relative part of these losses increases considerably and can prevent a successful Skull melting experiment. Analytical results are in good agreement with experimental (calorimetric) measurements of the power consumption in a typical Skull run (cubic stabilized zirconia), and with corresponding numerical simulations of the Skull process. The thermal conductivity of the Skull crust was estimated from experimental data.
ASJC Scopus Sachgebiete
- Chemie (insg.)
- Allgemeine Chemie
- Werkstoffwissenschaften (insg.)
- Allgemeine Materialwissenschaften
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
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in: Crystal research and technology, Jahrgang 34, Nr. 3, 16.04.1999, S. 319-328.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Power consumption of skull melting, Part I
T2 - Analytical aspects and experiments
AU - Gross, Christoph
AU - Assmus, Wolf
AU - Muiznieks, Andris
AU - Raming, Georg
AU - Mühlbauer, A.
AU - Stenzel, Christian
N1 - Copyright: Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.
PY - 1999/4/16
Y1 - 1999/4/16
N2 - An analytical model for a Skull melting set-up is presented, which describes the power absorption in the melt and the losses in the inductor coil and the cold crucible. A strong dependence of the relative size of these quantities on the applied frequency has been found. Above a characteristic frequency, where the skin depth equals about one half of the melt radius, only a small percentage of the overall power (typically 10% for oxide melts) is lost in the copper coil and the crucible. Below this frequency, the relative part of these losses increases considerably and can prevent a successful Skull melting experiment. Analytical results are in good agreement with experimental (calorimetric) measurements of the power consumption in a typical Skull run (cubic stabilized zirconia), and with corresponding numerical simulations of the Skull process. The thermal conductivity of the Skull crust was estimated from experimental data.
AB - An analytical model for a Skull melting set-up is presented, which describes the power absorption in the melt and the losses in the inductor coil and the cold crucible. A strong dependence of the relative size of these quantities on the applied frequency has been found. Above a characteristic frequency, where the skin depth equals about one half of the melt radius, only a small percentage of the overall power (typically 10% for oxide melts) is lost in the copper coil and the crucible. Below this frequency, the relative part of these losses increases considerably and can prevent a successful Skull melting experiment. Analytical results are in good agreement with experimental (calorimetric) measurements of the power consumption in a typical Skull run (cubic stabilized zirconia), and with corresponding numerical simulations of the Skull process. The thermal conductivity of the Skull crust was estimated from experimental data.
UR - http://www.scopus.com/inward/record.url?scp=0032670876&partnerID=8YFLogxK
U2 - 10.1002/(SICI)1521-4079(199903)34:3<319::AID-CRAT319>3.0.CO;2-M
DO - 10.1002/(SICI)1521-4079(199903)34:3<319::AID-CRAT319>3.0.CO;2-M
M3 - Article
AN - SCOPUS:0032670876
VL - 34
SP - 319
EP - 328
JO - Crystal research and technology
JF - Crystal research and technology
SN - 0232-1300
IS - 3
ER -