TY - JOUR

T1 - Photoelectron spectromicroscopy of electrochemically induced oxygen spillover at the Pt/YSZ interface

AU - Luerßen, B.

AU - Günther, S.

AU - Marbach, H.

AU - Kiskinova, M.

AU - Janek, J.

AU - Imbihl, R.

N1 - Funding Information: This work was financially supported by an EC Grant under Contract No. EBRCH-GECT920013 and Sincrotrone Trieste SCpA.

PY - 2000/1/21

Y1 - 2000/1/21

N2 - Scanning photoelectron microscopy (SPEM) has been applied to study the processes at the interface between the oxygen ion conducting solid electrolyte YSZ (yttrium stabilized zirconia) and a microstructured 500 Å thick Pt film on top of the YSZ when electrical potentials are applied. An electrochemically induced oxygen spillover onto the Pt surface has been observed upon electrochemical pumping with a positive potential applied to the Pt film. The spillover species was characterized in X-ray photoelectron spectroscopy by an O 1s binding energy of 530.4 eV which is identical to that of chemisorbed oxygen from the gas phase.

AB - Scanning photoelectron microscopy (SPEM) has been applied to study the processes at the interface between the oxygen ion conducting solid electrolyte YSZ (yttrium stabilized zirconia) and a microstructured 500 Å thick Pt film on top of the YSZ when electrical potentials are applied. An electrochemically induced oxygen spillover onto the Pt surface has been observed upon electrochemical pumping with a positive potential applied to the Pt film. The spillover species was characterized in X-ray photoelectron spectroscopy by an O 1s binding energy of 530.4 eV which is identical to that of chemisorbed oxygen from the gas phase.

UR - http://www.scopus.com/inward/record.url?scp=0000969194&partnerID=8YFLogxK

U2 - 10.1016/S0009-2614(99)01302-0

DO - 10.1016/S0009-2614(99)01302-0

M3 - Article

AN - SCOPUS:0000969194

VL - 316

SP - 331

EP - 335

JO - Chemical physics letters

JF - Chemical physics letters

SN - 0009-2614

IS - 5-6

ER -