Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach

Publikation: Konferenzbeitrag › Paper › Forschung

Autoren

  • Matthias Becker

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Details

OriginalspracheEnglisch
Seiten1817-1823
PublikationsstatusVeröffentlicht - 2009
VeranstaltungAsia Pacific Industrial Engineering and Management Systems Conference 2009 - Kitakyushu, Japan
Dauer: 4 Dez. 2009 → 4 Dez. 2009

Konferenz

KonferenzAsia Pacific Industrial Engineering and Management Systems Conference 2009
Land/GebietJapan
Zeitraum4 Dez. 2009 → 4 Dez. 2009

Zitieren

Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. / Becker, Matthias.
2009. 1817-1823 Beitrag in Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.

Publikation: Konferenzbeitrag › Paper › Forschung

Becker, M 2009, 'Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach', Beitrag in Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan, 4 Dez. 2009 - 4 Dez. 2009 S. 1817-1823.
Becker, M. (2009). Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. 1817-1823. Beitrag in Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.
Becker M. Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. 2009. Beitrag in Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.
Becker, Matthias. / Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. Beitrag in Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.
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