Optimized dv/dt, di/dt Sensing for a Digitally Controlled Slope Shaping Gate Driver

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

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  • Infineon Technologies Austria AG
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OriginalspracheEnglisch
Titel des Sammelwerks2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
Seiten3564-3569
Seitenumfang6
ISBN (elektronisch)9781509053667
ISBN (Print)9781509053667
PublikationsstatusVeröffentlicht - 2017
Extern publiziertJa
Veranstaltung32nd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2017 - Tampa, USA / Vereinigte Staaten
Dauer: 26 März 201730 März 2017

Publikationsreihe

NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
ISSN (elektronisch)2470-6647

Abstract

In a digitally controlled slope shaping system, reliable detection of both voltage and current slope is required to enable a closed-loop control for various power switches independent of system parameters. In most state-of-the-art works, this is realized by monitoring the absolute voltage and current values. Better accuracy at lower DC power loss is achieved by sensing techniques for a reliable passive detection, which is achieved through avoiding DC paths from the high voltage network into the sensing network. Using a high-speed analog-to-digital converter, the whole waveform of the transient derivative can be stored digitally and prepared for a predictive cycle-by-cycle regulation, without requiring high-precision digital differentiation algorithms. To gain an accurate representation of the voltage and current derivative waveforms, system parasitics are investigated and classified in three sections: (1) component parasitics, which are identified by s-parameter measurements and extraction of equivalent circuit models, (2) PCB design issues related to the sensing circuit, and (3) interconnections between adjacent boards. The contribution of this paper is an optimized sensing network on the basis of the experimental study supporting fast transition slopes up to 100 V/ns and 1 A/ns and beyond, making the sensing technique attractive for slope shaping of fast switching devices like modern generation IGBTs, CoolMOSTM and SiC mosfets. Measurements of the optimized dv/dt and di/dt setups are demonstrated for a hard switched IGBT power stage.

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Optimized dv/dt, di/dt Sensing for a Digitally Controlled Slope Shaping Gate Driver. / Groeger, Johannes; Schindler, Alexis; Wicht, Bernhard et al.
2017 IEEE Applied Power Electronics Conference and Exposition (APEC). Institute of Electrical and Electronics Engineers Inc., 2017. S. 3564-3569 7931209 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Groeger, J, Schindler, A, Wicht, B & Norling, K 2017, Optimized dv/dt, di/dt Sensing for a Digitally Controlled Slope Shaping Gate Driver. in 2017 IEEE Applied Power Electronics Conference and Exposition (APEC)., 7931209, Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC, Institute of Electrical and Electronics Engineers Inc., S. 3564-3569, 32nd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2017, Tampa, USA / Vereinigte Staaten, 26 März 2017. https://doi.org/10.1109/APEC.2017.7931209
Groeger, J., Schindler, A., Wicht, B., & Norling, K. (2017). Optimized dv/dt, di/dt Sensing for a Digitally Controlled Slope Shaping Gate Driver. In 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) (S. 3564-3569). Artikel 7931209 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APEC.2017.7931209
Groeger J, Schindler A, Wicht B, Norling K. Optimized dv/dt, di/dt Sensing for a Digitally Controlled Slope Shaping Gate Driver. in 2017 IEEE Applied Power Electronics Conference and Exposition (APEC). Institute of Electrical and Electronics Engineers Inc. 2017. S. 3564-3569. 7931209. (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC). doi: 10.1109/APEC.2017.7931209
Groeger, Johannes ; Schindler, Alexis ; Wicht, Bernhard et al. / Optimized dv/dt, di/dt Sensing for a Digitally Controlled Slope Shaping Gate Driver. 2017 IEEE Applied Power Electronics Conference and Exposition (APEC). Institute of Electrical and Electronics Engineers Inc., 2017. S. 3564-3569 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC).
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abstract = "In a digitally controlled slope shaping system, reliable detection of both voltage and current slope is required to enable a closed-loop control for various power switches independent of system parameters. In most state-of-the-art works, this is realized by monitoring the absolute voltage and current values. Better accuracy at lower DC power loss is achieved by sensing techniques for a reliable passive detection, which is achieved through avoiding DC paths from the high voltage network into the sensing network. Using a high-speed analog-to-digital converter, the whole waveform of the transient derivative can be stored digitally and prepared for a predictive cycle-by-cycle regulation, without requiring high-precision digital differentiation algorithms. To gain an accurate representation of the voltage and current derivative waveforms, system parasitics are investigated and classified in three sections: (1) component parasitics, which are identified by s-parameter measurements and extraction of equivalent circuit models, (2) PCB design issues related to the sensing circuit, and (3) interconnections between adjacent boards. The contribution of this paper is an optimized sensing network on the basis of the experimental study supporting fast transition slopes up to 100 V/ns and 1 A/ns and beyond, making the sensing technique attractive for slope shaping of fast switching devices like modern generation IGBTs, CoolMOSTM and SiC mosfets. Measurements of the optimized dv/dt and di/dt setups are demonstrated for a hard switched IGBT power stage.",
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AU - Groeger, Johannes

AU - Schindler, Alexis

AU - Wicht, Bernhard

AU - Norling, Karl

N1 - Publisher Copyright: © 2017 IEEE. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.

PY - 2017

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