Details
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | B231-B238 |
| Fachzeitschrift | Applied optics |
| Jahrgang | 62 |
| Ausgabenummer | 7 |
| Publikationsstatus | Veröffentlicht - 1 März 2023 |
Abstract
The 2022 Optical Interference Measurement Problem comprised the determination of the refractive index of a thin tantalum pentoxide film at a wavelength of 532 nm and the characterization of the UV band edge as an optional task.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Atom- und Molekularphysik sowie Optik
- Ingenieurwesen (insg.)
- Ingenieurwesen (sonstige)
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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in: Applied optics, Jahrgang 62, Nr. 7, 01.03.2023, S. B231-B238.
Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Peer-Review
}
TY - JOUR
T1 - Optical interference coatings
T2 - measurement problem 2022 [Invited]
AU - Trost, Marcus
AU - Schröder, Sven
AU - Carstens, Florian
AU - Ristau, Detlev
PY - 2023/3/1
Y1 - 2023/3/1
N2 - The 2022 Optical Interference Measurement Problem comprised the determination of the refractive index of a thin tantalum pentoxide film at a wavelength of 532 nm and the characterization of the UV band edge as an optional task.
AB - The 2022 Optical Interference Measurement Problem comprised the determination of the refractive index of a thin tantalum pentoxide film at a wavelength of 532 nm and the characterization of the UV band edge as an optional task.
UR - http://www.scopus.com/inward/record.url?scp=85149130218&partnerID=8YFLogxK
U2 - 10.1364/AO.480479
DO - 10.1364/AO.480479
M3 - Article
AN - SCOPUS:85149130218
VL - 62
SP - B231-B238
JO - Applied optics
JF - Applied optics
SN - 1559-128X
IS - 7
ER -