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| Originalsprache | Deutsch |
|---|---|
| Publikationsstatus | Veröffentlicht - 2018 |
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Optical digital microscopy and frequency domain analysis as a quality control of solid composite dielectrics in high voltage applications. / Werle, Peter; Saadati, Hassan; Seifert, J. M.
2018.
2018.
Publikation: Konferenzbeitrag › Paper › Forschung
Werle, P., Saadati, H., & Seifert, J. M. (2018). Optical digital microscopy and frequency domain analysis as a quality control of solid composite dielectrics in high voltage applications.
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title = "Optical digital microscopy and frequency domain analysis as a quality control of solid composite dielectrics in high voltage applications",
author = "Peter Werle and Hassan Saadati and Seifert, {J. M.}",
year = "2018",
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TY - CONF
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AU - Werle, Peter
AU - Saadati, Hassan
AU - Seifert, J. M.
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