Details
Originalsprache | Englisch |
---|---|
Titel des Sammelwerks | Advances in Optical Thin Films IV |
Publikationsstatus | Veröffentlicht - 3 Okt. 2011 |
Extern publiziert | Ja |
Veranstaltung | Advances in Optical Thin Films IV - Marseille, Frankreich Dauer: 5 Sept. 2011 → 7 Sept. 2011 |
Publikationsreihe
Name | Proceedings of SPIE - The International Society for Optical Engineering |
---|---|
Band | 8168 |
ISSN (Print) | 0277-786X |
Abstract
The present study deals with the characterization of hafnia, alumina, and zirconia coatings as well as mixtures thereof with respect to applications in the UV. Emphasis is placed on optical properties, particularly on the relation between UV refractive index and absorption edge. The shift of the coatings is investigated as well as the mechanical stress. Finally, we present the results of stress measurements performed for quarterwave stacks deposited on different substrates in a broad range of deposition temperatures. In this study, no systematic dependence of the result of the stress measurement on the substrate material and geometry could be identified.
ASJC Scopus Sachgebiete
- Werkstoffwissenschaften (insg.)
- Elektronische, optische und magnetische Materialien
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Informatik (insg.)
- Angewandte Informatik
- Mathematik (insg.)
- Angewandte Mathematik
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
Zitieren
- Standard
- Harvard
- Apa
- Vancouver
- BibTex
- RIS
Advances in Optical Thin Films IV. 2011. 1 (Proceedings of SPIE - The International Society for Optical Engineering; Band 8168).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Optical and mechanical properties of oxide UV coatings, prepared by PVD techniques
AU - Stenzel, Olaf
AU - Schürmann, Mark
AU - Wilbrandt, Steffen
AU - Kaiser, Norbert
AU - Tünnermann, Andreas
AU - Mende, Mathias
AU - Ehlers, Henrik
AU - Ristau, Detlev
AU - Bruns, Stefan
AU - Vergöhl, Michael
AU - Riggers, Werner
AU - Bischoff, Martin
AU - Held, Mario
PY - 2011/10/3
Y1 - 2011/10/3
N2 - The present study deals with the characterization of hafnia, alumina, and zirconia coatings as well as mixtures thereof with respect to applications in the UV. Emphasis is placed on optical properties, particularly on the relation between UV refractive index and absorption edge. The shift of the coatings is investigated as well as the mechanical stress. Finally, we present the results of stress measurements performed for quarterwave stacks deposited on different substrates in a broad range of deposition temperatures. In this study, no systematic dependence of the result of the stress measurement on the substrate material and geometry could be identified.
AB - The present study deals with the characterization of hafnia, alumina, and zirconia coatings as well as mixtures thereof with respect to applications in the UV. Emphasis is placed on optical properties, particularly on the relation between UV refractive index and absorption edge. The shift of the coatings is investigated as well as the mechanical stress. Finally, we present the results of stress measurements performed for quarterwave stacks deposited on different substrates in a broad range of deposition temperatures. In this study, no systematic dependence of the result of the stress measurement on the substrate material and geometry could be identified.
KW - Alumina
KW - Hafnia
KW - Mechanical stress
KW - Multilayers
KW - Optical constants
UR - http://www.scopus.com/inward/record.url?scp=80455125900&partnerID=8YFLogxK
U2 - 10.1117/12.896775
DO - 10.1117/12.896775
M3 - Conference contribution
AN - SCOPUS:80455125900
SN - 9780819487940
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Advances in Optical Thin Films IV
T2 - Advances in Optical Thin Films IV
Y2 - 5 September 2011 through 7 September 2011
ER -