On-line semiconductor switching loss measurement system for an advanced condition monitoring concept

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autorschaft

  • Tobias Krone
  • Lan Dang Hung
  • Marco Jung
  • Axel Mertens

Externe Organisationen

  • Fraunhofer-Institut für Windenergiesysteme (IWES)
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des Sammelwerks2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
ISBN (elektronisch)9789075815245
PublikationsstatusVeröffentlicht - 25 Okt. 2016
Veranstaltung18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe - Karlsruhe, Deutschland
Dauer: 5 Sept. 20169 Sept. 2016

Publikationsreihe

Name2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe

Abstract

In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results.

ASJC Scopus Sachgebiete

Zitieren

On-line semiconductor switching loss measurement system for an advanced condition monitoring concept. / Krone, Tobias; Hung, Lan Dang; Jung, Marco et al.
2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe. Institute of Electrical and Electronics Engineers Inc., 2016. 7695546 (2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Krone, T, Hung, LD, Jung, M & Mertens, A 2016, On-line semiconductor switching loss measurement system for an advanced condition monitoring concept. in 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe., 7695546, 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe, Institute of Electrical and Electronics Engineers Inc., 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe, Karlsruhe, Deutschland, 5 Sept. 2016. https://doi.org/10.1109/EPE.2016.7695546
Krone, T., Hung, L. D., Jung, M., & Mertens, A. (2016). On-line semiconductor switching loss measurement system for an advanced condition monitoring concept. In 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe Artikel 7695546 (2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPE.2016.7695546
Krone T, Hung LD, Jung M, Mertens A. On-line semiconductor switching loss measurement system for an advanced condition monitoring concept. in 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe. Institute of Electrical and Electronics Engineers Inc. 2016. 7695546. (2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe). doi: 10.1109/EPE.2016.7695546
Krone, Tobias ; Hung, Lan Dang ; Jung, Marco et al. / On-line semiconductor switching loss measurement system for an advanced condition monitoring concept. 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe. Institute of Electrical and Electronics Engineers Inc., 2016. (2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe).
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AU - Krone, Tobias

AU - Hung, Lan Dang

AU - Jung, Marco

AU - Mertens, Axel

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KW - Switching losses

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