TY - JOUR

T1 - On the unique evaluation of local lattice parameters by convergent-beam electron diffraction

AU - Maier, H. J.

AU - Keller, R. R.

AU - Renner, H.

AU - Mughrabi, H.

AU - Preston, A.

N1 - Funding Information: ACICNOWLEDGMEWS Financial support by the Deutsche Forschungsgemeinschaft and the Volkswagen Stiftung are gratefully acknowledged. One of the authors (R.R.K.) additionally thanks the National Research Council Past-Doctoral Research Associateship

PY - 1996/7

Y1 - 1996/7

N2 - We summarize some practical aspects of using convergent-beam electron diffraction (CBED) patterns for determination of three-dimensional lattice parameters in crystalline materials. Owing to the insensitivities of certain lattice spacings to changes in lattice parameters, and to measurement errors imposed by finite higher-order Laue zone (HOLZ) linewidths, most CBED patterns can be simulated by a number of different lattice parameter combinations. Unique combinations are found by fitting several patterns obtained from the same area. In cases where a unique set of all six parameters cannot be found, semiquantitative information about elastic stress and strain states can still be extracted. The number of obtainable lattice parameters is affected by the symmetry of the pattern and by the specific HOLZ reflections which are present, for a given accelerating voltage. Symmetry-breaking distortions in patterns from nominally orthorhombic systems can often be attributed to deviations in lattice angles as small as 0 01-0 02° away from 90°, even if such angular distortions are not expected from knowledge of the material’s bulk behaviour. The correct simulation of CBED patterns further requires consideration of foil thinning artefacts on HOLZ line positions. We show that an intelligent choice of zone axis can provide useful information even from difficult sample geometries.

AB - We summarize some practical aspects of using convergent-beam electron diffraction (CBED) patterns for determination of three-dimensional lattice parameters in crystalline materials. Owing to the insensitivities of certain lattice spacings to changes in lattice parameters, and to measurement errors imposed by finite higher-order Laue zone (HOLZ) linewidths, most CBED patterns can be simulated by a number of different lattice parameter combinations. Unique combinations are found by fitting several patterns obtained from the same area. In cases where a unique set of all six parameters cannot be found, semiquantitative information about elastic stress and strain states can still be extracted. The number of obtainable lattice parameters is affected by the symmetry of the pattern and by the specific HOLZ reflections which are present, for a given accelerating voltage. Symmetry-breaking distortions in patterns from nominally orthorhombic systems can often be attributed to deviations in lattice angles as small as 0 01-0 02° away from 90°, even if such angular distortions are not expected from knowledge of the material’s bulk behaviour. The correct simulation of CBED patterns further requires consideration of foil thinning artefacts on HOLZ line positions. We show that an intelligent choice of zone axis can provide useful information even from difficult sample geometries.

UR - http://www.scopus.com/inward/record.url?scp=0041113837&partnerID=8YFLogxK

U2 - 10.1080/01418619608239688

DO - 10.1080/01418619608239688

M3 - Article

AN - SCOPUS:0041113837

VL - 74

SP - 23

EP - 43

JO - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

JF - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

SN - 0141-8610

IS - 1

ER -