Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) |
| Herausgeber/-innen | Manfred Dietrich, Ondrej Novak |
| Seiten | 97-102 |
| Seitenumfang | 6 |
| ISBN (elektronisch) | 9781538604717 |
| Publikationsstatus | Veröffentlicht - 2017 |
Abstract
On the contrary to the digital world, no coverage definition exists in the Analog/Mixed-Signal (AMS) context. As digital coverage helps digital designers and verification engineers to evaluate their verification progress, analog designers do not have such metrics. This paper proposes a set of different analog coverage metrics, which improve the confidence in AMS circuit verification. We will demonstrate, that no single overall coverage metric exists. However, as with digital coverage, the proposed analog coverage metrics could substantially help in rating the verification process. Illustrated by a complex AMS circuit example we will explore the limits of analog coverage methodologies as well as the benefits on different levels of abstraction ranging from transistor level up to system level.
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2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). Hrsg. / Manfred Dietrich; Ondrej Novak. 2017. S. 97-102 7934589.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - Novel metrics for Analog Mixed-Signal coverage
AU - Fürtig, Andreas
AU - Gläser, Georg
AU - Grimm, Christoph
AU - Hedrich, Lars
AU - Heinen, Stefan
AU - Lee, Hyun-Sek Lukas
AU - Nitsche, Gregor
AU - Olbrich, Markus
AU - Radojicic, Carna
AU - Speicher, Fabian
N1 - Publisher Copyright: © 2017 IEEE.
PY - 2017
Y1 - 2017
N2 - On the contrary to the digital world, no coverage definition exists in the Analog/Mixed-Signal (AMS) context. As digital coverage helps digital designers and verification engineers to evaluate their verification progress, analog designers do not have such metrics. This paper proposes a set of different analog coverage metrics, which improve the confidence in AMS circuit verification. We will demonstrate, that no single overall coverage metric exists. However, as with digital coverage, the proposed analog coverage metrics could substantially help in rating the verification process. Illustrated by a complex AMS circuit example we will explore the limits of analog coverage methodologies as well as the benefits on different levels of abstraction ranging from transistor level up to system level.
AB - On the contrary to the digital world, no coverage definition exists in the Analog/Mixed-Signal (AMS) context. As digital coverage helps digital designers and verification engineers to evaluate their verification progress, analog designers do not have such metrics. This paper proposes a set of different analog coverage metrics, which improve the confidence in AMS circuit verification. We will demonstrate, that no single overall coverage metric exists. However, as with digital coverage, the proposed analog coverage metrics could substantially help in rating the verification process. Illustrated by a complex AMS circuit example we will explore the limits of analog coverage methodologies as well as the benefits on different levels of abstraction ranging from transistor level up to system level.
UR - http://www.scopus.com/inward/record.url?scp=85021415164&partnerID=8YFLogxK
U2 - 10.1109/DDECS.2017.7934589
DO - 10.1109/DDECS.2017.7934589
M3 - Conference contribution
SP - 97
EP - 102
BT - 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
A2 - Dietrich, Manfred
A2 - Novak, Ondrej
ER -