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Novel Method for Measuring Carrier Diffusion Lengths in Metal-Halide Perovskites

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autorschaft

  • Benjamin Grimm
  • Verena Steckenreiter
  • Annika Raugewitz
  • Felix Haase
  • Rolf Brendel
  • Robby Peibst
  • Jan Schmidt

Externe Organisationen

  • Institut für Solarenergieforschung GmbH (ISFH)

Details

OriginalspracheEnglisch
FachzeitschriftPhysica Status Solidi - Rapid Research Letters
PublikationsstatusAngenommen/Im Druck - 10 März 2025

Abstract

Herein, it is demonstrated that the carrier diffusion lengths in metal-halide perovskite films can be estimated from contactless quasi-steady-state photoconductance measurements applying an approximate analysis. The approach to metal-halide perovskite layers of different compositions is applied, which is fabricated by wet-chemical processing and coevaporation. The extracted diffusion lengths are in the order of several micrometers for both examined perovskite layers and hence sufficiently large, i.e., much larger than the film thickness, to process high-efficiency solar cells from them. The presented analysis provides a useful and easy-to-apply methodology for the fast assessment of the electronic quality of metal-halide perovskite layers in the lab, without the need of complete solar cell processing.

ASJC Scopus Sachgebiete

Zitieren

Novel Method for Measuring Carrier Diffusion Lengths in Metal-Halide Perovskites. / Grimm, Benjamin; Steckenreiter, Verena; Raugewitz, Annika et al.
in: Physica Status Solidi - Rapid Research Letters, 10.03.2025.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Grimm B, Steckenreiter V, Raugewitz A, Haase F, Brendel R, Peibst R et al. Novel Method for Measuring Carrier Diffusion Lengths in Metal-Halide Perovskites. Physica Status Solidi - Rapid Research Letters. 2025 Mär 10. doi: 10.1002/pssr.202400386
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AU - Grimm, Benjamin

AU - Steckenreiter, Verena

AU - Raugewitz, Annika

AU - Haase, Felix

AU - Brendel, Rolf

AU - Peibst, Robby

AU - Schmidt, Jan

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N2 - Herein, it is demonstrated that the carrier diffusion lengths in metal-halide perovskite films can be estimated from contactless quasi-steady-state photoconductance measurements applying an approximate analysis. The approach to metal-halide perovskite layers of different compositions is applied, which is fabricated by wet-chemical processing and coevaporation. The extracted diffusion lengths are in the order of several micrometers for both examined perovskite layers and hence sufficiently large, i.e., much larger than the film thickness, to process high-efficiency solar cells from them. The presented analysis provides a useful and easy-to-apply methodology for the fast assessment of the electronic quality of metal-halide perovskite layers in the lab, without the need of complete solar cell processing.

AB - Herein, it is demonstrated that the carrier diffusion lengths in metal-halide perovskite films can be estimated from contactless quasi-steady-state photoconductance measurements applying an approximate analysis. The approach to metal-halide perovskite layers of different compositions is applied, which is fabricated by wet-chemical processing and coevaporation. The extracted diffusion lengths are in the order of several micrometers for both examined perovskite layers and hence sufficiently large, i.e., much larger than the film thickness, to process high-efficiency solar cells from them. The presented analysis provides a useful and easy-to-apply methodology for the fast assessment of the electronic quality of metal-halide perovskite layers in the lab, without the need of complete solar cell processing.

KW - charge carrier lifetimes

KW - diffusion lengths

KW - perovskites

KW - quasi-steady-state photoconductance

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