Noninvasive detection of charge rearrangement in a quantum dot in high magnetic fields

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • C. Fricke
  • M. C. Rogge
  • B. Harke
  • M. Reinwald
  • W. Wegscheider
  • F. Hohls
  • R. J. Haug

Organisationseinheiten

Externe Organisationen

  • Max-Planck-Institut für biophysikalische Chemie (Karl-Friedrich-Bonhoeffer-Institut)
  • Universität Regensburg
  • University of Cambridge
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Aufsatznummer193302
FachzeitschriftPhysical Review B - Condensed Matter and Materials Physics
Jahrgang72
Ausgabenummer19
PublikationsstatusVeröffentlicht - 15 Nov. 2005

Abstract

We demonstrate electron redistribution caused by magnetic field on a single quantum dot measured by means of a quantum point contact as noninvasive detector. Our device, which is fabricated by local anodic oxidation, allows us to control independently the quantum point contact and all tunneling barriers of the quantum dot. Thus we are able to measure both the change of the quantum dot charge and also changes of the electron configuration at constant number of electrons on the quantum dot. We use these features to exploit the quantum dot in a high magnetic field where transport through the quantum dot displays the effects of Landau shells and spin blockade. We confirm the internal rearrangement of electrons as function of the magnetic field for a fixed number of electrons on the quantum dot.

ASJC Scopus Sachgebiete

Zitieren

Noninvasive detection of charge rearrangement in a quantum dot in high magnetic fields. / Fricke, C.; Rogge, M. C.; Harke, B. et al.
in: Physical Review B - Condensed Matter and Materials Physics, Jahrgang 72, Nr. 19, 193302, 15.11.2005.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Fricke C, Rogge MC, Harke B, Reinwald M, Wegscheider W, Hohls F et al. Noninvasive detection of charge rearrangement in a quantum dot in high magnetic fields. Physical Review B - Condensed Matter and Materials Physics. 2005 Nov 15;72(19):193302. doi: 10.1103/PhysRevB.72.193302
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