Noninvasive detection of charge rearrangement in a quantum dot

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Autoren

  • C. Fricke
  • M. C. Rogge
  • B. Harke
  • M. Reinwald
  • W. Wegscheider
  • F. Hohls
  • R. J. Haug

Organisationseinheiten

Externe Organisationen

  • Universität Regensburg
  • University of Cambridge
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Titel des SammelwerksPhysics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B
Seiten793-794
Seitenumfang2
PublikationsstatusVeröffentlicht - 1 Dez. 2007
Veranstaltung28th International Conference on the Physics of Semiconductors, ICPS 2006 - Vienna, Österreich
Dauer: 24 Juli 200628 Juli 2006

Publikationsreihe

NameAIP Conference Proceedings
Band893
ISSN (Print)0094-243X
ISSN (elektronisch)1551-7616

Abstract

We demonstrate new results on electron redistribution on a single quantum dot caused by magnetic field. A quantum point contact is used to detect changes in the quantum dot charge. We are able to measure both the change of the quantum dot charge and also changes of the electron configuration at constant number of electrons on the quantum dot. These features are used to exploit the quantum dot in a high magnetic field where transport through the quantum dot displays the effects of Landau shells and spin blockade.

ASJC Scopus Sachgebiete

Zitieren

Noninvasive detection of charge rearrangement in a quantum dot. / Fricke, C.; Rogge, M. C.; Harke, B. et al.
Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B. 2007. S. 793-794 (AIP Conference Proceedings; Band 893).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Fricke, C, Rogge, MC, Harke, B, Reinwald, M, Wegscheider, W, Hohls, F & Haug, RJ 2007, Noninvasive detection of charge rearrangement in a quantum dot. in Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B. AIP Conference Proceedings, Bd. 893, S. 793-794, 28th International Conference on the Physics of Semiconductors, ICPS 2006, Vienna, Österreich, 24 Juli 2006. https://doi.org/10.1063/1.2730129
Fricke, C., Rogge, M. C., Harke, B., Reinwald, M., Wegscheider, W., Hohls, F., & Haug, R. J. (2007). Noninvasive detection of charge rearrangement in a quantum dot. In Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B (S. 793-794). (AIP Conference Proceedings; Band 893). https://doi.org/10.1063/1.2730129
Fricke C, Rogge MC, Harke B, Reinwald M, Wegscheider W, Hohls F et al. Noninvasive detection of charge rearrangement in a quantum dot. in Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B. 2007. S. 793-794. (AIP Conference Proceedings). doi: 10.1063/1.2730129
Fricke, C. ; Rogge, M. C. ; Harke, B. et al. / Noninvasive detection of charge rearrangement in a quantum dot. Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B. 2007. S. 793-794 (AIP Conference Proceedings).
Download
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AU - Rogge, M. C.

AU - Harke, B.

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AU - Hohls, F.

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