TY - JOUR

T1 - Neutron reflectometry to measure in situ the rate determining step of lithium ion transport through thin silicon layers and interfaces

AU - Hüger, Erwin

AU - Stahn, Jochen

AU - Heitjans, Paul

AU - Schmidt, Harald

N1 - Funding Information: Financial support from the Deutsche Forschungsgemeinschaft (DFG) under the contract HU 2170/2-1 is gratefully acknowledged. This research project has been supported by the European Commission under the 7th Framework Program through the ‘Research Infrastructures’ action of the ‘Capacities’ Program, NMI3-II grant number 283883. This work is based on experiments performed at the Swiss spallation neutron source (SINQ), at the instruments AMOR and Morpheus, PSI Villigen, Switzerland. Thanks are due to E. Witt (U Hannover) for preparing the LiNbO3 sputter targets in the frame of DFG FOR 1277. P. H. is grateful to Niedersächsisches Ministerium für Wissenschaft und Kultur (MWK) for support within a Niedersachsen Professorship (VWZN3095).

PY - 2019/8/14

Y1 - 2019/8/14

N2 - Li ion transport through thin (14-22 nm) amorphous silicon layers adjacent to lithium metal oxide layers (lithium niobate) was studied by in situ neutron reflectometry experiments and the control mechanism was determined. It was found that the interface between amorphous silicon and the oxide material does not hinder Li transport. It is restricted by Li diffusion in the silicon material. This finding based on in situ experiments confirms results obtained ex situ and destructively by secondary ion mass spectrometry (SIMS) depth profiling investigations. The Li permeabilities obtained from the present experiments are in agreement with those obtained from ex situ SIMS measurements showing similar activation enthalpies.

AB - Li ion transport through thin (14-22 nm) amorphous silicon layers adjacent to lithium metal oxide layers (lithium niobate) was studied by in situ neutron reflectometry experiments and the control mechanism was determined. It was found that the interface between amorphous silicon and the oxide material does not hinder Li transport. It is restricted by Li diffusion in the silicon material. This finding based on in situ experiments confirms results obtained ex situ and destructively by secondary ion mass spectrometry (SIMS) depth profiling investigations. The Li permeabilities obtained from the present experiments are in agreement with those obtained from ex situ SIMS measurements showing similar activation enthalpies.

UR - http://www.scopus.com/inward/record.url?scp=85070788625&partnerID=8YFLogxK

U2 - 10.1039/c9cp01222b

DO - 10.1039/c9cp01222b

M3 - Article

C2 - 31120073

AN - SCOPUS:85070788625

VL - 21

SP - 16444

EP - 16450

JO - Physical Chemistry Chemical Physics

JF - Physical Chemistry Chemical Physics

SN - 1463-9076

IS - 30

ER -